Patents by Inventor Joseph C. MCBRIDE

Joseph C. MCBRIDE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240225554
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Application
    Filed: September 28, 2023
    Publication date: July 11, 2024
    Inventors: Stephen J. Waydo, Christopher J. Brouse, Ian R. Shapiro, Joseph C. McBride, Michael O'Reilly, Myra Mary Haggerty
  • Publication number: 20240130688
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Application
    Filed: September 27, 2023
    Publication date: April 25, 2024
    Inventors: Stephen J. Waydo, Christopher J. Brouse, Ian R. Shapiro, Joseph C. McBride, Michael O'Reilly, Myra Mary Haggerty
  • Patent number: 11793467
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Grant
    Filed: January 2, 2020
    Date of Patent: October 24, 2023
    Assignee: Apple Inc.
    Inventors: Stephen J. Waydo, Christopher J. Brouse, Ian R. Shapiro, Joseph C. McBride, Michael O'Reilly, Myra Mary Haggerty
  • Publication number: 20200214640
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Application
    Filed: January 2, 2020
    Publication date: July 9, 2020
    Inventors: Stephen J. Waydo, Christopher J. Brouse, Ian R. Shapiro, Joseph C. McBride, Michael O'Reilly, Myra Mary Haggerty
  • Patent number: 10524735
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Grant
    Filed: February 5, 2018
    Date of Patent: January 7, 2020
    Assignee: Apple Inc.
    Inventors: Stephen J. Waydo, Christopher J. Brouse, Ian R. Shapiro, Joseph C. McBride, Michael O'Reilly, Myra Mary Haggerty
  • Publication number: 20180279956
    Abstract: This relates to methods for measuring irregularities in a signal and corresponding devices. The devices can include a PPG sensor unit configured to detect multiple occurrences of a given event in the measured signal(s) over a sampling interval. In some instances, the device can register the occurrences of the events. In some examples, the device can include one or more motion sensors configured to detect whether the device is in a low-motion state. The device may delay initiating measurements when the device is not in a low-motion state to enhance measurement accuracy. Examples of the disclosure further include resetting the sample procedure based on one or more factors such as the number of non-qualifying measurements. In some examples, the device can be configured to perform both primary and secondary measurements, where the primary measurements can include readings using a set of operating conditions different from the secondary measurements.
    Type: Application
    Filed: February 5, 2018
    Publication date: October 4, 2018
    Inventors: Stephen J. WAYDO, Christopher J. BROUSE, Ian R. SHAPIRO, Joseph C. MCBRIDE, Michael O'REILLY, Myra Mary HAGGERTY