Abstract: A method is presented for generating functional tests for a microprocessor having several operating modes and features. A test module template file includes a basic set of instructions required to configure the microprocessor to operate in any one of the several operating modes and with any of the several features enabled. A user modifies a copy of the test module template file to form a test module file which provides a desired operating environment and causes the microprocessor to perform a desired activity and to produce a test result. An assembler takes as input the test module file, along with the contents of any library files to be included, and produces both an assembly code list file and a test code file. The assembly code list file is a computer program listing containing assembly language instructions and data.

Abstract: A method is presented for event-related functional testing of a microprocessor. A model of the microprocessor is adapted to produce a trigger event, perform a target activity, and respond to a control signal. The target activity occurs over several system clock signal cycles. A control signal generator receives the trigger event and generates the control signal a selectable number of clock cycles (i.e., a delay time) after the trigger event. A testing program includes a program loop which causes the microprocessor model to produce the trigger event, perform the target activity to produce a test result, and compare the test result to an expected result. The program loop is repeatedly executed until the microprocessor model responds to the control signal during each clock cycle of the target activity. If the test result matches the expected result during each execution of the program loop, the microprocessor properly responds to the control signal during the target activity.