Patents by Inventor Joseph Ching Hua Lee

Joseph Ching Hua Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10248097
    Abstract: The invention provides methods, systems and computer programs for optimizing standard operating procedure for a control system. The invention comprises (i) recording a sequence of control system operator actions, (ii) identifying a control system process corresponding to the recorded sequence of control system operator actions, (iii) retrieving a standard operating procedure associated with the identified control system process, (iv) determining a first set of deviations between (a) the recorded sequence of control system operator actions and (b) the standard operating procedure, (v) determining a second set of deviations between (c) a set of KPI values associated with the recorded sequence of control system operator actions and (d) a set of KPI values associated with the standard operating procedure, and (vi) modifying the standard operating procedure to reduce deviation between (e) the recorded sequence of control system operator actions and (f) said standard operating procedure.
    Type: Grant
    Filed: May 9, 2016
    Date of Patent: April 2, 2019
    Assignee: Yokogawa Electric Corporation
    Inventors: Bijuraj Velayudhan Pandiyath, Amit Ulhasrao Wadaskar, Joseph Ching Hua Lee
  • Publication number: 20170322536
    Abstract: The invention provides methods, systems and computer programs for optimizing standard operating procedure for a control system. The invention comprises (i) recording a sequence of control system operator actions, (ii) identifying a control system process corresponding to the recorded sequence of control system operator actions, (iii) retrieving a standard operating procedure associated with the identified control system process, (iv) determining a first set of deviations between (a) the recorded sequence of control system operator actions and (b) the standard operating procedure, (v) determining a second set of deviations between (c) a set of KPI values associated with the recorded sequence of control system operator actions and (d) a set of KPI values associated with the standard operating procedure, and (vi) modifying the standard operating procedure to reduce deviation between (e) the recorded sequence of control system operator actions and (f) said standard operating procedure.
    Type: Application
    Filed: May 9, 2016
    Publication date: November 9, 2017
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Bijuraj Velayudhan PANDIYATH, Amit Ulhasrao WADASKAR, Joseph Ching Hua LEE
  • Patent number: 8930001
    Abstract: A method of model identification for a process with unknown initial conditions in an industrial plant, the method comprising collecting a set of manipulated variables and corresponding set of process variables from the process; obtaining a plurality of manipulated variables from the collected set of manipulated variables; for each of the plurality of manipulated variables, obtaining optimal model parameters of a model transfer function and computing a model fitting index for optimized simulated process variables generated by the model transfer function using the optimal model parameters; identifying a best model fitting index among the model fitting indices computed; selecting a manipulated variable associated with the best model fitting index as an initial steady state condition for the model transfer function; and selecting the optimal model parameters corresponding with the best model fitting index as the best model parameters of the model transfer function to tune the controller.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: January 6, 2015
    Assignee: Yokogawa Electric Corporation
    Inventors: Shengjing Mu, Stephen Wei Hong Weng, Joseph Ching Hua Lee
  • Publication number: 20130085717
    Abstract: A method of qualifying performance of a conventional control valve in a process plant, the valve being controlled by a controller, the method comprising a processor obtaining data samples from a database stored on a server of the process plant, each data sample comprising a process variable, a set-point, and a manipulated variable; the processor computing a non-linearity index from the data samples and determining if the non-linearity index is greater than a threshold value; if the non-linearity index is greater than the threshold value, the processor charting a plot of the process variable against the manipulated variable and determining if the plot has an elliptical or rectangular fit; and if the plot has an elliptical fit, the processor determining if a percentage of the total number of data samples lying within a theoretical ellipse encompassed within the elliptical fit is less than or equal to a preset percentage.
    Type: Application
    Filed: September 30, 2011
    Publication date: April 4, 2013
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Sankar Selvaraj, Lakshmi Kiran Kanchi, Joseph Ching Hua Lee
  • Publication number: 20130073061
    Abstract: A method of model identification for a process with unknown initial conditions in an industrial plant, the method comprising collecting a set of manipulated variables and corresponding set of process variables from the process; obtaining a plurality of manipulated variables from the collected set of manipulated variables; for each of the plurality of manipulated variables, obtaining optimal model parameters of a model transfer function and computing a model fitting index for optimized simulated process variables generated by the model transfer function using the optimal model parameters; identifying a best model fitting index among the model fitting indices computed; selecting a manipulated variable associated with the best model fitting index as an initial steady state condition for the model transfer function; and selecting the optimal model parameters corresponding with the best model fitting index as the best model parameters of the model transfer function to tune the controller.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 21, 2013
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Shengjing Mu, Stephen Wei Hong Weng, Joseph Ching Hua Lee
  • Patent number: 8224473
    Abstract: An apparatus for monitoring an industrial process comprising a plurality of variables. The apparatus comprises a defining module configured for defining a normal-condition data set may comprise data values of the variables when the industrial process is operating under a normal condition and for defining an abnormal-condition data set may comprise data values of the variables when the industrial process is operating under an abnormal condition; a modelling module configured for modelling a normal-condition model from the normal-condition data set and modelling an abnormal-condition model from the abnormal-condition data set; a plotting module configured for plotting a normal-condition plot from the normal-condition model and plotting an abnormal-condition plot from the abnormal-condition model; and an analysis module configured for analysing live data values of the variables for simultaneous display with the normal-condition plot and the abnormal-condition plot.
    Type: Grant
    Filed: January 26, 2010
    Date of Patent: July 17, 2012
    Assignee: Yokogawa Electric Corporation
    Inventors: Sankar Selvaraj, Joseph Ching Hua Lee, Sreenivas Yelneedi
  • Patent number: 7877232
    Abstract: A metric based performance monitoring a process control system is disclosed in which diagnostics are performed at multiple levels of the plant, results of the diagnostics converted into Key Performance Indicators and compared to predetermined benchmarks such that an integrated and overall determination of the plants' performance may be displayed.
    Type: Grant
    Filed: August 27, 2008
    Date of Patent: January 25, 2011
    Assignee: Yokogawa Electric Corporation
    Inventors: Joseph Ching Hua Lee, Sharad Vishwasrao, Naveen Kashyap, Emelin Ornelas
  • Publication number: 20100286969
    Abstract: An apparatus for monitoring an industrial process comprising a plurality of variables. The apparatus comprises a defining module configured for defining a normal-condition data set may comprise data values of the variables when the industrial process is operating under a normal condition and for defining an abnormal-condition data set may comprise data values of the variables when the industrial process is operating under an abnormal condition; a modelling module configured for modelling a normal-condition model from the normal-condition data set and modelling an abnormal-condition model from the abnormal-condition data set; a plotting module configured for plotting a normal-condition plot from the normal-condition model and plotting an abnormal-condition plot from the abnormal-condition model; and an analysis module configured for analysing live data values of the variables for simultaneous display with the normal-condition plot and the abnormal-condition plot.
    Type: Application
    Filed: January 26, 2010
    Publication date: November 11, 2010
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Sankar Selvaraj, Joseph Ching Hua Lee, Sreenivas Yelneedi
  • Patent number: 7672796
    Abstract: A method for providing a system for establishing a control valve performance in a process operation. The system includes establishing an expected flow rate for a control valve by measuring a differential pressure between an upstream and downstream position of a control valve of interest and using the formula Q = Cv × ? ? ( x ) × ? ? ? P G , measuring an actual flow rate across the control valve, comparing the actual flow rate with the expected flow rate to determine the difference in value between the actual and expected flow rate, determining if the difference is within an acceptable range of values from the expected flow rate and establishing the performance of the control valve.
    Type: Grant
    Filed: June 18, 2007
    Date of Patent: March 2, 2010
    Assignee: Yokogawa Electric Corporation
    Inventors: Joseph Ching Hua Lee, Sharad Vishwasrao, Naveen Kashyap, Emelin Ornelas
  • Publication number: 20090105865
    Abstract: A metric based performance monitoring A process control system is disclosed in which diagnostics are performed at multiple levels of the plant, results of the diagnostics converted into Key Performance Indicators and compared to predetermined benchmarks such that an integrated and overall determination of the plants' performance may be displayed.
    Type: Application
    Filed: August 27, 2008
    Publication date: April 23, 2009
    Applicant: Yokogawa Electric Corporation
    Inventors: Joseph Ching Hua Lee, Sharad Vishwasrao, Naveen Kashyap, Emelin Ornelas
  • Publication number: 20080243291
    Abstract: The invention is a system for assessing and diagnosing performance of a control loop, comprising a Data Collection Section which collects data of two parameters of the control loop for an installed valve. The data collected is processed in a Linear Regression Section to generate a linear regression. A User Setting Port is provided to define the tolerance band and the boundary points. The generated linear regression, together with the defined tolerance band and boundary points are processed in a Linear Approximation Section to generate an acceptable reference region.
    Type: Application
    Filed: January 18, 2008
    Publication date: October 2, 2008
    Applicant: Yokogawa Electric Corporation
    Inventors: Joseph Ching Hua Lee, Sharad Vishwasrao, Emelin Ornelas, Naoya Kishimoto, Tatsuhiko Imai