Abstract: A test head apparatus for use in electronic device test equipment includes a test head with an annular test head body including a probe card carrier attachment region of a first circumference and a test electronic card storage region with a second circumference greater than the first circumference. The probe card carrier attachment region of the test head body is compatible with probe card carriers for existing test heads. The enlarged test electronic card storage region provides more space for electronic equipment, while providing more viewing area of the probe card. The apparatus also includes an improved probe card attachment configuration.

Abstract: A method of loading an electronic component into a carrier includes the step of setting an electronic component onto a pedestal including a pedestal post. A carrier with a clip is positioned over the pedestal. The pedestal post is forced against the clip such that the clip is in a retracted position that allows the electronic component to be positioned in the carrier. The pedestal post is then removed from the clip so that the electronic component is secured in the carrier by the clip.