Abstract: A method is disclosed of temperature compensation for measurement of a temperature sensitive parameter of semiconductor IC chips, particularly temperature compensation for a maximum frequency measurement (Fmax) and speed sort/categorization of semiconductor IC chips. The method comprises determining a change of a temperature sensitive parameter of the chip with temperature; measuring the temperature sensitive parameter of the chip during testing of the chip; measuring the chip temperature directly during or following the measurement of the temperature sensitive parameter; and determining an adjusted temperature sensitive parameter of the chip based upon the measured temperature sensitive parameter of the chip during testing, the measured chip temperature, and the determined change of the temperature sensitive parameter of the chip with temperature.

Abstract: A system and method are disclosed for sequential insertion processing of speech recognition results and, more particularly, server-based automated processing of speech recognition results. In addition, the use of formed document templates to facilitate the server-based automated sequential insertion of speech recognition results is disclosed. The formed document templates can include embedded dictionaries with related processing rules, including processing rules including positioning information.

Abstract: A system and method is disclosed for generating formed document templates and, more particularly, for generating such formed document templates to facilitate the automated sequential insertion of speech recognition results into document template files. The formed document templates can include data dictionaries and related processing rules that can be utilized to analyze speech recognition results as they are sequentially inserted into document templates to generate resultant data files.