Abstract: A corrugated pallet folded together from two planar blanks, including a pallet top that supports a load above a floor, and a pallet bottom that rests on the floor. Each pallet top and pallet bottom has multiple double thickness interior support ribs folded vertically from the plane of the pallet top and bottom. Ribs from the pallet top intersect with ribs from the pallet bottom perpendicularly and support the pallet top on the pallet bottom. Multiple mechanical vertical locks hold the pallet top in vertically spaced relation with the pallet bottom with middle straps folded vertically from the pallet top and/or pallet bottom into contact with interior surfaces of the pallet and lock directly into sides of the interior support ribs at positions intermediate the pallet top and bottom. Reinforcement tubes are provided over intersections of double thickness ribs at the corners of the pallet while folded doubled thickness ribs provide compression support near the center.

Abstract: A corrugated pallet folded together from two planar blanks, including a pallet top that supports a load above a floor, and a pallet bottom that rests on the floor. Each pallet top and pallet bottom has multiple double thickness interior support ribs folded vertically from the plane of the pallet top and bottom. Ribs from the pallet top intersect with ribs from the pallet bottom perpendicularly and support the pallet top on the pallet bottom. Multiple mechanical vertical locks hold the pallet top in vertically spaced relation with the pallet bottom with middle straps folded vertically from the pallet top and/or pallet bottom into contact with interior surfaces of the pallet and lock directly into sides of the interior support ribs at positions intermediate the pallet top and bottom. Reinforcement tubes are provided over intersections of double thickness ribs at the corners of the pallet while folded doubled thickness ribs provide compression support near the center.

Abstract: A method for assembling a corrugated skid includes selecting first and second planar corrugated blanks and folding the first blank to produce a first double thickness rib that extends out of the plane of the first blank. That blank is placed on a horizontal surface having blades protruding upwards such that the blades penetrate the middle of the double thickness rib and hold it perpendicular to the horizontal surface. The second blank is folded to produce a second double thickness rib that extends out of the plane of the second blank. The second blank is placed on top of the first blank such that the first rib penetrates a slot in the second blank, and the first and second blanks are engaged with one side of each blank facing each other forming a double thickness skid deck with ribs forming depending legs for supporting the skid deck above a supporting surface.

Abstract: A corrugated paperboard pallet is produced from two flat blanks which comprise a pallet top and a pallet bottom. The two blanks are each folded to produce only two parallel vertically extending double thickness ribs, three horizontal panels, two vertical side walls and two horizontal flaps. The ribs of the pallet top and pallet bottom lock each other from opening in the center of the pallet by intersecting perpendicularly with notches in the ribs. The horizontal flaps lock the ribs from opening at the edges of the pallet by intersecting perpendicularly with notches, and the vertical sidewalls include vertical flaps that open inward defining fork passages whereby the vertical flaps lock said horizontal flaps from opening.

Abstract: A process for assembling a corrugated pallet having of two die cut corrugated paperboard blanks that form a pallet top and a pallet bottom, with each having at least one vertically extending double thickness rib, each rib having at least one notch, wherein said notches lock the opposing ribs from opening when the pallet top and pallet bottom are vertically nested together. In performance of the process a mix of machine and human performed operations is used. The machine forms the rib on each blank by applying in-plane pressure to the blank through protruding elements on the machine that engage the blank and move in relation towards each other, and the machine maintains the in-plane pressure to keep the rib from opening until a time after the pallet top and bottom are nested together. The machine uses rib folding plates that apply out-of-plane forces to the blanks to assist forming of the ribs by rotating in the out-of-plane direction when the in-plane compression is applied.

Abstract: A corrugated paperboard pallet is produced from two flat blanks which comprise a pallet top and a pallet bottom. The two blanks are each folded to produce only two parallel vertically extending double thickness ribs, three horizontal panels, two vertical side walls and two horizontal flaps. The ribs of the pallet top and pallet bottom lock each other from opening in the center of the pallet by intersecting perpendicularly with notches in the ribs. The horizontal flaps lock the ribs from opening at the edges of the pallet by intersecting perpendicularly with notches, and the vertical sidewalls include vertical flaps that open inward defining fork passages whereby the vertical flaps lock said horizontal flaps from opening.

Abstract: An apparatus and method for detecting pattern defects and/or particles on the front surface of a semiconductor wafer having repetitive patterns includes a laser for illuminating an area on the front surface with a beam of polarized light. A lens collects light scattered from the area and forms a Fourier diffraction pattern of the area illuminated. A Fourier mask blocks out scattered light collected by the lens at locations in the Fourier diffraction pattern where the intensity is above a predetermined level indicative of background information and leaves in light at locations where the intensity is below the threshold level indicative of possible particle information. The Fourier mask includes a spatial light modulator and a polarization discriminator. The lens also images the area illuminated onto a camera using scattered light collected from the area by the lens and not blocked out by the Fourier mask.

Abstract: A method and apparatus for inspecting a surface of a semiconductor wafer having repetitive patterns for contaminant particles using scattered light which involves directing two beams of light at different approach angles onto the surface in a manner so as to illuminate two intersecting stripe shaped regions on the surface. An imaging lens collects scattered light from the surface as the semiconductor wafer is moving and then images the scattered light collected onto a CCD camera having a square array sensor and arranged to operate in a time delayed integration (TDI) mode. The field of view of the CCD camera is centered at the intersection of the two striped regions. Each light beam striking the surface produces a Fourier diffraction pattern of scattered light in the back focal plane of the imaging lens. In setting up the apparatus, the angle of incidence of one of the light beams is adjusted to shift one of the diffraction patterns, if necessary, so that it overlaps the other diffraction pattern.

Abstract: A method and apparatus for inspecting a surface of a semiconductor wafer having repetitive patterns for contaminant particles using scattered light by illuminating an area on the surface with two beams of light at different approach angles which are independent from each other and then imaging the area illuminated onto a camera positioned above the surface using an imaging lens. Each light beam striking the surface of the semiconductor wafer produces a Fourier diffraction pattern of light scattered from the surface in the back focal plane of the imaging lens. The two diffraction patterns are offset from each other if the two approach angles are not symmetrically disposed relative to an axis of the wafer. In setting up the apparatus, the angle of incidence of one of the beams is adjusted to shift one of the diffraction patterns, if necessary, so that it overlaps the other diffraction pattern.

Abstract: An apparatus and method for detecting particles on a surface of a semiconductor wafer having repetitive patterns includes a laser for illuminating an area on the front surface at grazing angle of incidence with a beam of polarized light. A lens collects light scattered from the area and forms a Fourier diffraction pattern of the area illuminated. A Fourier mask blocks out light collected by the lens at locations in the Fourier diffraction pattern where the intensity is above a predetermined level indicative of background information and leaves in light at locations where the intensity is below the threshold level indicative of possible particle information. The Fourier mask includes an optically addressable spatial light modulator and a polarization discriminator. A camera detects scattered light collected from the area by the lens and not blocked out by the Fourier mask.

Abstract: An apparatus for detecting particles on the front surface of a patterned semiconductor wafer having repetitive patterns includes a laser for illuminating an area on the front surface at grazing angle of incidence with a beam of polarized light. A lens collects light scattered from the area and forms a Fourier diffraction pattern of the area illuminated. A Fourier mask blocks out light collected by the lens at locations in the Fourier diffraction pattern where the intensity is above a predetermined level indicative of background information and leaves in light at locations where the intensity is below the threshold level indicative of possible particle information. The Fourier mask includes an optically addressable spatial light modulator and a crossed polarizer with the Fourier diffraction pattern being used as both a read beam and a write beam for the spatial light modulator. A camera detects scattered light collected from the area by the lens and not blocked out by the Fourier mask.

Abstract: A laser gyroscope is provided that utilizes a single frequency shifter, in the form of a Bragg cell, to adjust the frequencies of counter-rotating optical signals in a thin film waveguide to achieve resonance along the optical path encountered by each of the signals. The system also utilizes two voltage to frequency convertors, each of which outputs an RF signal to a respective frequency shifter. Each voltage to frequency convertor is modulated by a modulation signal that includes a DC component and an RF signal. The single frequency shifter approach results in fewer required components for proper operation of the thin film laser gyroscope. Redundant back-up components can be added to the gyroscope to guard against the event of a component failure. Alternately, the laser gyroscope is inherently more tolerable of low fabrication yield because of the redundancies.

Abstract: Method and apparatus for tuning an optical gyroscope, such as a MOG, to an operating frequency within a predetermined range of operating frequencies. The method includes an initial step of providing a compound resonator structure having a first optical waveguide resonator [16] optically coupled to a laser [14]. There is also provided a second optical waveguide resonator [18] optically coupled to the first resonator. The second resonator is constructed to extract a significant amount of energy from the first resonator when a coresonance frequency condition exists with the first resonator and to extract an insignificant amount of energy from the first resonator when a coresonance frequency condition does not exist. The method includes a step of varying an output frequency of the laser to a first frequency where a coresonance frequency condition exists.