Abstract: A laser system including a rack, a plurality of laser modules mounted in the rack to drive light through an optical fiber exiting the system, and a power distribution module to distribute electricity through circuit branches coupled to the laser modules is generally presented. In some embodiments, the rack includes a horizontal cross-member with a bottom rack flange extending vertically and defining a bottom of an opening in the rack.

Abstract: A laser module service shelf is generally presented. In some embodiments, a laser system includes a rack including a stack of slots to support a plurality of laser modules in first positions within the rack, wherein the rack comprises a pair of struts extending at opposite sides of an opening in the rack through which the laser modules may pass, and a module service shelf attachable to the struts to support a weight of one of the laser modules in a second position that is cantilevered from the rack in alignment with the opening and one of the slots, wherein the module service shelf comprises a plurality of detachable sections. Other embodiments are also disclosed and claimed.

Abstract: A laser optical fiber tray is generally presented. In some embodiments, the optical fiber tray comprises an enclosure, coupled with a laser system rack, having an opening in the enclosure to accept a feeding fiber exiting from the laser system rack, an opening in the enclosure to allow passage of the feeding fiber out of the enclosure, and a user-accessible space within the enclosure to contain a length of the feeding fiber. In some embodiments, the optical fiber tray is mounted to a top panel of the laser system rack. In some embodiments, the optical fiber tray is mounted to a top panel of an external module which is mounted to a top panel of the laser system rack. Other embodiments are also disclosed and claimed.

Abstract: A laser optical fiber tray is generally presented. In some embodiments, the optical fiber tray comprises an enclosure, coupled with a laser system rack, having an opening in the enclosure to accept a feeding fiber exiting from the laser system rack, an opening in the enclosure to allow passage of the feeding fiber out of the enclosure, and a user-accessible space within the enclosure to contain a length of the feeding fiber. In some embodiments, the optical fiber tray is mounted to a top panel of the laser system rack. In some embodiments, the optical fiber tray is mounted to a top panel of an external module which is mounted to a top panel of the laser system rack. Other embodiments are also disclosed and claimed.

Abstract: A laser optical fiber tray is generally presented. In some embodiments, the optical fiber tray comprises an enclosure having an opening in a bottom of the enclosure to accept a feeding fiber exiting from a top of a laser system rack, an opening in a side of the enclosure to allow passage of the feeding fiber out of the enclosure, a removable panel to allow access to an interior of the enclosure and two or more coil guides affixed within the interior of the enclosure, the coil guides spaced apart by a distance that defines a minimum diameter for a loop of the feeding fiber to be contained within the enclosure. In some embodiments, the optical fiber tray is mounted to a top panel of the laser system rack. In some embodiments, the optical fiber tray is mounted to a top panel of an external module which is mounted to a top panel of the laser system rack. Other embodiments are also disclosed and claimed.

Abstract: A laser module service shelf is generally presented. In some embodiments, a laser system includes a rack including a stack of slots to support a plurality of laser modules in first positions within the rack, wherein the rack comprises a pair of struts extending at opposite sides of an opening in the rack through which the laser modules may pass, and a module service shelf attachable to the struts to support a weight of one of the laser modules in a second position that is cantilevered from the rack in alignment with the opening and one of the slots, wherein the module service shelf comprises a plurality of detachable sections. Other embodiments are also disclosed and claimed.

Abstract: A laser system including a rack, a plurality of laser modules mounted in the rack to drive light through an optical fiber exiting the system, and a power distribution module to distribute electricity through circuit branches coupled to the laser modules is generally presented. In some embodiments, the rack includes a horizontal cross-member with a bottom rack flange extending vertically and defining a bottom of an opening in the rack.

Abstract: A laser optical fiber tray is generally presented. In some embodiments, the optical fiber tray comprises an enclosure having an opening in a bottom of the enclosure to accept a feeding fiber exiting from a top of a laser system rack, an opening in a side of the enclosure to allow passage of the feeding fiber out of the enclosure, a removable panel to allow access to an interior of the enclosure and two or more coil guides affixed within the interior of the enclosure, the coil guides spaced apart by a distance that defines a minimum diameter for a loop of the feeding fiber to be contained within the enclosure. In some embodiments, the optical fiber tray is mounted to a top panel of the laser system rack. In some embodiments, the optical fiber tray is mounted to a top panel of an external module which is mounted to a top panel of the laser system rack. Other embodiments are also disclosed and claimed.

Abstract: An improved method and apparatus for detecting problems with fit and finish of manufactured articles is presented which uses structured light. Two or more structured light images acquired from opposing directions is used to measure the fit of mating surfaces while avoiding false positives caused by small defects near the seam.

Abstract: Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.

Abstract: Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.

Abstract: Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.

Abstract: An improved method and apparatus for detecting problems with fit and finish of manufactured articles is presented which uses structured light. Two or more structured light images acquired from opposing directions is used to measure the fit of mating surfaces while avoiding false positives caused by small defects near the seam.

Abstract: Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.

Abstract: Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.