Patents by Inventor Joseph John Van Horn

Joseph John Van Horn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Selective wafer-level testing and burn-in
    Patent number: 6255208
    Abstract: Selective electrical connections between an electronic component and a test substrate are made using an electrical conductive material. The conductive material of the present invention is a dissolvable material, allowing for rework and repair of a wafer at the wafer-level, and retesting at the wafer-level. In addition, the conductive material may also be used in a permanent package, since the conductive material of the present invention provides complete electrical conductivity and connection between the electronic component and the substrate.
    Type: Grant
    Filed: January 25, 1999
    Date of Patent: July 3, 2001
    Assignee: International Business Machines Corporation
    Inventors: William Emmett Bernier, Claude Louis Bertin, Anilkumar Chinuprasad Bhatt, Michael Anthony Gaynes, Erik Leigh Hedberg, Nikhil M. Murdeshwar, Mark Vincent Pierson, William R. Tonti, Paul A. Totta, Joseph John Van Horn, Jerzy Maria Zalesinski