Abstract: Apparatus for inspecting the wall thickness of non-round containers includes capacitive sensors which cooperate with oscillator means to provide voltage signals corresponding to container wall thickness to electronic processors which convert the voltage signals to corresponding thickness values and compare them with the desired thickness values. The apparatus subjects the containers to translational movement through the inspection zone while resisting rotational movement. The sensors have at least one sensor element having capacitive sensor portions that are not in the same plane as other capacitive sensor elements or a single sensor element having portions in more than one plane. The sensor elements may be individual sensor elements which are each adapted to inspect different portions of a container or may, in another embodiment, be a single sensor element. The sensors are adapted to be movably mounted so as to maintain efficient contact with non-round containers during inspection.

Abstract: Apparatus for inspecting the wall thickness of non-round containers includes capacitive sensors which cooperate with oscillator means to provide voltage signals corresponding to container wall thickness to electronic processors which convert the voltage signals to corresponding thickness values and compare them with the desired thickness values. The apparatus subjects the containers to translational movement through the inspection zone while resisting rotational movement. The sensors have at least one sensor element having capacitive sensor portions that are not in the same plane as other capacitive sensor elements or a single sensor element having portions in more than one plane. The sensor elements may be individual sensor elements which are each adapted to inspect different portions of a container or may, in another embodiment, be a single sensor element. The sensors are adapted to be movably mounted so as to maintain efficient contact with non-round containers during inspection.