Abstract: A system and method for tracking a status of a portable electronic file is provided. The system includes a workflow server having at least a rules engine and a tracking engine, the workflow server being configured to update a status tracker that is embedded into the portable electronic file, and at least one end user connected via a network to the workflow server. The end user is capable of receiving and submitting the portable electronic file to and from the workflow server, whereby the workflow server is configured to track at least a submission of the portable electronic file. Upon actuation of the embedded status tracker within the portable electronic file by the end user, a status report indicating the status of the portable electronic file is displayed to the end user.

Abstract: A method and system is provided for authenticating electronic forms prior to download. A Form Administrator may enable authentication requirement for an End User and also select an authentication scheme. The End User will not be allowed access to an electronic form unless authenticated. The invention also includes a method and system for delivering and presenting electronic forms to an End User through a purely browser based application, without requiring the installation of additional software or browser plug-ins.

Abstract: The present invention relates to compositions and methods in preventing and/or treating diseases caused by Aspergillus. In particular, the present invention is directed to Aspergillus vaccine preparations and methods of making and using thereof.

Abstract: A system and method for precisely detecting very small distances between a measurement probe having an elongated nozzle with a relatively long and thin orifice. The proximity sensor uses a constant gas flow and senses a mass flow rate within a pneumatic bridge to detect very small distances. The system and method use a flow restrictor and/or snubber made of porous material and/or a mass flow rate controller that in various combinations allow for detection of very small distances in the nanometer to sub-nanometer range.

Abstract: A stump boot for use by an ankle disarticulation patient having a stump. The stump boot includes a sole, an inner casing, and an outer casing having a substantially rectangular cutout covered by a flexible member. The inner casing is custom molded to fit the stump and insertable within the outer casing. The sole is integrally attached to the outer casing and includes a foam inner sole, an outer sole having a non-skid grip material, a contoured wedge therebetween having an adjustable rubber build-up and a rounded bottom. A buckle and a strap are both integrally attached to the outer casing opposite one another. The strap has a securing fastener and a securing means and wraps over the flexible member and through the buckle for securing the stump within the stump boot.

Abstract: A choked-flow orifice gas gauge proximity sensor for sensing a difference between a reference surface standoff and a measurement surface standoff is disclosed. Unlike existing proximity sensors, the gas gauge proximity sensor of the present invention replaces the use of a mass flow controller with a choked flow orifice. The use of a choked flow orifice provides for reduced equipment cost and improved system reliability. A gas supply forces gas into the proximity sensor. The gas is forced through the choked flow orifice to achieve sonic conditions at which time the mass flow rate becomes largely independent of pressure variations. The flow of gas proceeds from the choked flow orifice into a sensor channel system. A mass flow sensor within the sensor channel system monitors flow rates to detect measurement standoffs that can be used to initiate a control action.

Abstract: A vacuum-driven gas gauge proximity sensor for sensing a difference between a reference surface standoff and a measurement surface standoff is disclosed. Unlike existing proximity sensors, the vacuum-driven gas gauge proximity sensor uses a vacuum to reverse the traditional flow of gas through a proximity sensor, such that gas flows inward across measurement and reference standoffs through measurement and reference nozzles. The conditioned ambient gas that is vacuumed into the reference and measurement nozzles flows through reference and measurement channels that are coupled at a junction into a single channel. The single channel is coupled to the vacuum that is used to evacuate the conditioned ambient gas through the proximity sensor. A bridge channel couples the reference and measurement channels. A mass flow sensor along the bridge channel monitors flow rates to detect measurement standoffs that can be used to initiate a control action. A pump-driven liquid flow proximity sensor is also disclosed.

Abstract: A vacuum-driven gas gauge proximity sensor for sensing a difference between a reference surface standoff and a measurement surface standoff is disclosed. Unlike existing proximity sensors, the vacuum-driven gas gauge proximity sensor uses a vacuum to reverse the traditional flow of gas through a proximity sensor, such that gas flows inward across measurement and reference standoffs through measurement and reference nozzles. The conditioned ambient gas that is vacuumed into the reference and measurement nozzles flows through reference and measurement channels that are coupled at a junction into a single channel. The single channel is coupled to the vacuum that is used to evacuate the conditioned ambient gas through the proximity sensor. A bridge channel couples the reference and measurement channels. A mass flow sensor along the bridge channel monitors flow rates to detect measurement standoffs that can be used to initiate a control action. A pump-driven liquid flow proximity sensor is also disclosed.

Abstract: A virtual gauging method for use in a lithographic process includes gauging a region at a surface of a wafer when the region is located away from an axis of illumination producing wafer surface data, while other portions of the wafer are being illuminated. The method also includes acquiring time-domain measurements representing the wafer surface data and converting the time-domain measurements into space-domain measurements. This conversion can be done using a finite-impulse-response (FIR) filter. The FIR filter can be triggered with a spatial interrupt, and a width of the FIR filter is modified in response to a velocity of travel of the wafer. The method further includes converting space-domain measurements into wafer correction data.

Abstract: A system and method that use a fluid gauge proximity sensor. A source of modulated unidirectional or alternating fluid flow travels along at least one path having a nozzle and a flow or pressure sensor. The fluid exists at a gap between the nozzle and a target. The sensor outputs an amplitude modulated signal that varies according to a size of the gap. The amplitude modulated signal is processed either digitally or in analog devices, which can include being filtered (e.g., band pass, band limited, high pass, etc. filter) to include the modulated frequency and sufficient bandwidth on either side of that frequency and/or being demodulated using a demodulator operating at the acoustical driver modulation frequency. Using this system and method can result in only ambient acoustical energy in a desired frequency range of the device actually having the opportunity to interfere with the device operation. This can lower the devices overall sensitivity to external acoustical noise and sensor offset.

Abstract: A gas gauge proximity sensor modulates a gas stream that is used to feed reference and measurement air gauges, respectively, in a reference portion proximate a reference surface and a measurement portion proximate a measurement surface. The gas stream can be modulated at a frequency at which there is minimal acoustical interference energy (e.g., minimal noise) in demodulated output signal. The sensor output can be filtered so that a measurement signal includes only the modulated frequency and side bands of that frequency to include the desired response band of the device as a whole. The filtered signal can be demodulated using a demodulator operating at a same frequency as the modulator to produce the demodulated output signal. In this embodiment, substantially only ambient acoustical energy in the band pass region may interfere with the device operation. Alternatively, the modulation can be introduced through the reference portion. A reference nozzle sets up a pressure field with the reference surface.

Abstract: A system and method are used to calibrate a focus portion of an exposure section of a lithography tool. A wafer is exposed so that a resulted or formed patterned image is tilted with respect to the wafer. The tilting can be imposed based on controlling a wafer stage to tilt the wafer or a reticle stage to tilt the reticle. The wafer is developed. Characteristics of the tilted patterned image are measured with a portion of the lithography tool to determine focus parameters of an exposure system. The portion can be an alignment system. The measuring step can measure band width and/or band location of the tilted patterned image. Sometimes, more than one patterned image is formed on the wafer, then the measuring step can measure distance between bands and shifting of the bands with respect to a central axis of the wafer. The focus parameters can be focus tilt errors and/or focus offset. The focus parameters are used to perform calibration.

Abstract: An apparatus and method for supporting and feeding printing plates in an imaging system. The apparatus includes a vacuum system for picking up an edge of a top printing plate from a stack of printing plates, and a peeling system including a pair of rotatable belts, a plurality of plate feed beams attached to, and extending between, the pair of rotatable belts, and a drive system for rotating the pair of rotatable belts to displace the plurality of plate feed beams between the top printing plate and an underlying printing plate in the stack of printing plates, thereby peeling the top printing plate from the stack of printing plates.

Abstract: A system and method for precisely detecting very small distances between a measurement probe having an elongated nozzle with a relatively long and thin orifice. The proximity sensor uses a constant gas flow and senses a mass flow rate within a pneumatic bridge to detect very small distances. The system and method use a flow restrictor and/or snubber made of porous material and/or a mass flow rate controller that in various combinations allow for detection of very small distances in the nanometer to sub-nanometer range.

Abstract: A substrate manager for a substrate exposure machine is used, in one example, as a platesetter. As such, it comprises a substrate storage system, containing one or more stacks of substrates, such as plates in one implementation. A substrate picker is provided for picking substrates from the stack of substrates. The substrates are then handed to a transfer system that conveys the substrates to an imaging engine. According to the invention, a substrate inverter system is also provided. This system inverts the substrates from being imaging or emulsion side down to emulsion side up in the present implementation. This allows plates, for example, which are stored emulsion side down in cassettes to be flipped to an emulsion side up orientation, and then transferred, using the substrate transfer system to the imaging engine. This flipping process has two advantages. First, the plates can be emulsion side up during the transfer. This prevents any damage to the sensitive plate emulsions.

Abstract: A system for monitoring wafer surface topography during a lithographic process is described that includes means for capturing wafer position and surface data at a first time when a wafer is at a first location, means for generating correction data for a second wafer location prior to the wafer reaching the second wafer location, and means for storing the correction data in a spatial delay line. The means for capturing wafer position and surface data includes means for capturing backplane position data with a plurality of stalk gauges. The means for generating correction data includes means for converting the wafer position and surface data from a time-domain into a space domain. The system also includes means for moving the wafer based on the correction data when the wafer is at the second wafer location at a second time.

Abstract: An apparatus and method for picking a single printing plate from a stack of printing plates. The apparatus includes a plurality of suction cups, a peeler, a drive system for displacing the suction cups and the peeler against the surface of the top printing plate on the stack, a vacuum source for supplying a vacuum to the suction cups to secure the suction cups against the surface of the top printing plate, and a system for rotatably displacing the suction cups relative to the peeler to peel a portion of the top printing plate off of the stack. The center line of rotation of the displacing system is located at a contact point between the peeler and the surface of the top printing plate. This prevents any relative motion of the top printing plate against the next, underlying printing plate on the stack during the peeling operation.

Abstract: An apparatus and method for picking a single printing plate from a stack of printing plates. The apparatus includes a plurality of suction cups, a peeler, a drive system for displacing the suction cups and the peeler against the surface of the top printing plate on the stack, a vacuum source for supplying a vacuum to the suction cups to secure the suction cups against the surface of the top printing plate, and a system for rotatably displacing the suction cups relative to the peeler to peel a portion of the top printing plate off of the stack. The center line of rotation of the displacing system is located at a contact point between the peeler and the surface of the top printing plate. This prevents any relative motion of the top printing plate against the next, underlying printing plate on the stack during the peeling operation.

Abstract: The present invention provides an apparatus and method for supporting and feeding printing plates in an imaging system. The apparatus comprises a vacuum system for picking up an edge of a top printing plate from a stack of printing plates, and a peeling system including a pair of rotatable belts, a plurality of plate feed beams attached to, and extending between, the pair of rotatable belts, and a drive system for rotating the pair of rotatable belts to displace the plurality of plate feed beams between the top printing plate and an underlying printing plate in the stack of printing plates, thereby peeling the top printing plate from the stack of printing plates.