Abstract: A composite voltage reference with improved temperature stability includes a monolithic voltage reference integrated circuit (“IC”). The voltage reference IC has an internal voltage reference, an internal OpAmp circuit including scaling resistors, a monolithic voltage reference IC temperature coefficient, and a user accessible input to vary a monolithic voltage reference IC output voltage. A second voltage reference has a second voltage reference temperature coefficient lower than the monolithic voltage reference IC temperature coefficient. The second voltage reference is electrically coupled to the user accessible input wherein the temperature coefficient of the composite circuit of the monolithic voltage reference IC and the second voltage reference is improved over the monolithic voltage reference IC temperature coefficient.

Abstract: A thermal anemometer for measuring airflow includes an ovenized semiconductor device including an internal oven. The oven is powered by an oven current such that the oven current varies with air flow over an outside surface of the semiconductor device. A resistor is electrically coupled between a source of power and the oven. An amplifier has an amplifier input and an amplifier output. The amplifier input is electrically coupled to the oven, wherein the amplifier output amplifier provides an electrical signal related to airflow over the ovenized semiconductor device. Also, a method for measuring airflow includes the steps of: providing a source of power, providing an ovenized semiconductor device, providing an amplifier, amplifying a signal representative of a heater current in the ovenized semiconductor device, and outputting the signal representative of the heater current as an indication of airflow over an outside surface of the ovenized semiconductor device.