Abstract: A device and system for purifying a fluid is provided. The system includes a tank having an interior space and a media container disposed within the interior space. A valve is provided that cooperates with an element within the interior, the valve being movable between an open and a closed position. The valve being biased to the open position when the element is not positioned within the interior space, wherein the interior space is fluidly coupled to the atmosphere in the open position. The valve further being configured to move to a closed position when the element is positioned within the interior space.

Abstract: A device and system for purifying a fluid is provided. The system includes a tank having an interior space and a media container disposed within the interior space. A valve is provided that cooperates with an element within the interior, the valve being movable between an open and a closed position. The valve being biased to the open position when the element is not positioned within the interior space, wherein the interior space is fluidly coupled to the atmosphere in the open position. The valve further being configured to move to a closed position when the element is positioned within the interior space.

Abstract: An apparatus, a method, and a computer-program product for identifying a location of abnormal emission on integrated circuits are disclosed. The location of abnormal emission on integrated circuits is identified by measuring an emission intensity for each of a plurality of voltages for each pixel in an emission image of an integrated circuit; generating a plot of the measured emission intensities as a function of the plurality of voltages for each area in the emission image of the integrated circuit; determining differences in emission intensities of the generated plot for a selected area compared to a plot for a corresponding area known to have no abnormal emission; and identifying location of abnormal emission corresponding to the selected area the detected difference of which exceeds a pre-determined threshold.

Abstract: A method is provided for selectively marking a region of integrated circuit (IC). The method provides an IC die with a first region located on a backside surface of a bulk silicon (Si) layer. A semi-transparent film is formed overlying the bulk Si layer, semi-transparent to light having a first wavelength. The semi-transparent film is irradiated with light having the first wavelength in the range of 1 to 2 microns. In response to irradiating the semi-transparent film with a first power density, the IC die first region is located. Then, in response to irradiating the semi-transparent film with a second power density, greater than the first power density, a region of the semi-transparent film is marked overlying the IC die first region. In one aspect, a region of the bulk Si layer underlying the marked (or ablated away) semi-transparent film is selectively etched to expose the IC die first region.

Abstract: A method is provided for selectively marking a region of integrated circuit (IC). The method provides an IC die with a first region located on a backside surface of a bulk silicon (Si) layer. A semi-transparent film is formed overlying the bulk Si layer, semi-transparent to light having a first wavelength. The semi-transparent film is irradiated with light having the first wavelength in the range of 1 to 2 microns. In response to irradiating the semi-transparent film with a first power density, the IC die first region is located. Then, in response to irradiating the semi-transparent film with a second power density, greater than the first power density, a region of the semi-transparent film is marked overlying the IC die first region. In one aspect, a region of the bulk Si layer underlying the marked (or ablated away) semi-transparent film is selectively etched to expose the IC die first region.

Abstract: The present invention is secure wireless network. The secure wireless network can include multiple receiver nodes coupled to corresponding high-precision clocks. Each of the receiver nodes can be configured to receive wireless frames transmitted both within and outside a secured geographic area covered by the secure wireless network. A master synchronization high-precision clock can be coupled to the corresponding high-precision clocks. Additionally, a position location system can be coupled to the receiver nodes. Specifically, the position location system can be programmed to compute estimated positions for individual ones of wireless nodes transmitting the wireless frames. Finally, access management logic can be coupled to the position location system. More particularly, the access management logic can be configured to manage access to the wireless network by the individual ones of the wireless nodes based upon the computed estimated positions.

Abstract: The present invention is secure wireless network. The secure wireless network can include multiple receiver nodes coupled to corresponding high-precision clocks. Each of the receiver nodes can be configured to receive wireless frames transmitted both within and outside a secured geographic area covered by the secure wireless network. A master synchronization high-precision clock can be coupled to the corresponding high-precision clocks. Additionally, a position location system can be coupled to the receiver nodes. Specifically, the position location system can be programmed to compute estimated positions for individual ones of wireless nodes transmitting the wireless frames. Finally, access management logic can be coupled to the position location system. More particularly, the access management logic can be configured to manage access to the wireless network by the individual ones of the wireless nodes based upon the computed estimated positions.

Abstract: An improved non-contact electrical measurement system, method, probe assembly, and probe. A probe having a photoemissive coating deposited thereon is provided and disposed substantially adjacent a measurement site of a test sample. The photoemissive coating of the probe is illuminated by a light source, and electrical measurements are made upon the photoemissive coating to determine the electrical characteristics of the measurement site.

Abstract: An improved non-contact electrical measurement system, method, probe assembly, and probe tip. A probe tip having a photoemissive coating deposited thereon is provided and disposed substantially adjacent a measurement site of a test sample. The photoemissive coating of the probe tip is illuminated by a light source, and electrical measurements are made upon the probe tip to determine the electrical characteristics of the measurement site.

Abstract: A circuit configuration which provides protection against damage to semiconductor devices, such as integrated circuits or discrete components caused by high energy events. An additional base region is formed in the epitaxial layer collector of a bipolar transistor. The added base region overlaps an isolation region having an opposite conductivity to the epitaxial layer. During a high energy event, the reverse breakdown of the junction formed between the added base region and the epitaxial layer is in parallel with the reverse breakdown of the junction formed between the epitaxial layer and the substrate. The breakdown voltage of the junction formed at the added base region is less than that of the epitaxial layer/substrate breakdown so that less power is dissipated as heat in the silicon. As a result, the likelihood of thermal damage to PN/junctions near silicon-aluminum contacts is reduced.

Abstract: An apparatus which is used for non-contact electrical measurement and physical alteration of certain characteristics and properties of electronic conductor devices. The apparatus includes a focused source of ultraviolet light which is capable of micron and sub-micron resolution.In the measurement mode the apparatus measures the energy of electrons ejected from a measurement site by the UV beam. This measurement is accomplished at a nulling/repelling device. In the alteration mode, the focused UV light beam interacts with various compounds, for example chemical gases, to create a selective reaction at specific locations at the surface of the device being operated upon.The measurement function can be related to voltage, current, temperature or the like and may be either qualitative or quantitative while being made in a non-contact basis.

Abstract: An apparatus which is used for non-contact electrical measurement and physical alteration of certain characteristics and properties of electronic conductor devices. The apparatus includes a focused source of ultraviolet light which is capable of micron and sub-micron resolution. In the measurement mode the apparatus measures the energy of electrons ejected from a measurement site by the UV beam. This measurement is accomplished at a nulling/repelling device. In the alteration mode, the focused UV light beam interacts with various compounds, for example chemical gases, to create a selective reaction at specific locations at the surface of the device being operated upon. The measurement function can be related to voltage, current, temperature or the like and may be either qualitative or quantitative while being made in a non-contact basis.

Abstract: The reaction product of silica gel or controlled pore glass and carboalkoxyalkyl silanes are suitable for use as packing in solid phase extraction columns for cleanup of urine samples for analysis of cannabinoids.

Abstract: A bonded phase silica product of the formula: ##STR1## in which ##STR2## is the backbone of a silica gel or controlled pore glass, X is selected from --O--, --S--, ##STR3## each R and R.sup.1 are each independently selected from hydrogen, an alkyl group of from 1 to 3 carbon atoms and --CH.sub.2).sub.m COOR.sup.3, R.sup.2 and R.sup.3 are each independently alkyl of from 1 to 4 carbon atoms, n is an integer of from 2 to 5, p is zero or one and m is an interger of from 1 to 4, is suitable for use in solid phase extraction for cleanup of urine samples for analysis of cannabinoids.

Abstract: A bonded phase silica product of the formula: ##STR1## in which ##STR2## is the backbone of a silica gel or controlled pore glass, X is selected from --O--, --S--, ##STR3## each R and R.sup.1 are each independently selected from hydrogen, an alkyl group of from 1 to 3 carbon atoms and --CH.sub.2).sub.m COOR.sup.3, R.sup.2 and R.sup.3 are each independently alkyl of from 1 to 4 carbon atoms, n is an integer of from 2 to 5, p is zero or one and m is an integer of from 1 to 4, is suitable for use in solid phase extraction for cleanup of urine samples for analysis of cannabinoids.

Abstract: The reaction product of silica gel or controlled pore glass and carboalkoxyalkyl silanes are suitable for use as packing in solid phase extraction columns for cleanup of urine samples for analysis of cannabinoids.