Abstract: A phased array ultrasonic testing device for positioning first and second phased array probes relative to a surface of a material to be tested. The testing device includes a first wedge configured to receive and orient the first phased array probe relative to the surface. A second wedge is configured to receive and orient the second phased array probe relative to the surface. A coupling structure is mounted to the first and second wedges and configured to selectively provide for the first and second wedges to move parallel to one another in a first direction and restrict relative movement of the first and second wedges in other directions.

Abstract: An instrumentation system that can include a chassis configured to receive a PCB assembly, where the PCB assembly can include a front edge forming a front plane, a first rear edge forming a first rear plane, and a second rear edge forming a second rear plane, with the first rear plane being spaced a greater distance away from the front plane than the second rear plane, and where the chassis can include a plurality of card slots configured to receive the PCB assembly, a 3U backplane configured to couple with the second rear edge of the card when the PCB assembly is installed in one of the plurality of card slots in the chassis.