Patents by Inventor Joseph Muehlenkamp

Joseph Muehlenkamp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Instrument for the measurement of x-ray beam characteristics
    Patent number: 4935950
    Abstract: An instrument for measuring the characteristics of an x-ray unit includes two pairs of photo detectors to measure the kVp of the x-ray beam, a single photo detector to measure the relative film exposure produced by the beam and another single photo detector used to measure the relative current in milliamps (mA) of the x-ray unit. The instrument multiplexes the signals and converts them to digital form for storage and analysis by a microprocessor. The output is a display the contents of which is user selectable either by a switch panel or through use of a remote control unit.
    Type: Grant
    Filed: November 28, 1988
    Date of Patent: June 19, 1990
    Assignee: Radiation Measurements, Inc.
    Inventors: Frank N. Ranallo, Larry A. DeWerd, Joseph Muehlenkamp