Abstract: A pulse latch includes a pulse generator and a latch circuit. The pulse generator generates first and second pulse signals. The first pulse signal is generated when a test enable signal is in a first state, and the second pulse signal is generated when the test enable signal is in a second state. The latch circuit outputs the latched signal by selectively latching a normal data input signal or a test data input signal. The latch circuit includes first and second tri-state elements. The first tri-state element is controlled by the first pulse signal to enable the test data input signal to be latched when the test enable signal is in the first state. The second tri-state element is controlled by the second pulse signal to enable the normal data input signal to be latched when the test enable signal is in the second state.

Abstract: A scan test circuit includes: a functional path, including: a D-type latch, for receiving an input and generating an output, the D-type latch including a feedback node; and a test path, including: a scan latch, for receiving a test input and generating an output. The scan test circuit also includes a tri-state inverter. The output of the test path is input to the feedback node of the D-type latch and also input to the tri-state inverter. The functional path is clocked by pulses generated by a pulse generator according to a system clock. The test path is clocked by a test clock generated according to a test enable signal and the system clock. When the test enable signal is enabled, the generation of the pulses is disabled.

Abstract: A pulse latch includes a pulse generator and a latch circuit. The pulse generator generates first and second pulse signals. The first pulse signal is generated when a test enable signal is in a first state, and the second pulse signal is generated when the test enable signal is in a second state. The latch circuit outputs the latched signal by selectively latching a normal data input signal or a test data input signal. The latch circuit includes first and second tri-state elements. The first tri-state element is controlled by the first pulse signal to enable the test data input signal to be latched when the test enable signal is in the first state. The second tri-state element is controlled by the second pulse signal to enable the normal data input signal to be latched when the test enable signal is in the second state.

Abstract: A scan test circuit includes: a functional path, including: a D-type latch, for receiving an input and generating an output, the D-type latch including a feedback node; and a test path, including: a scan latch, for receiving a test input and generating an output. The scan test circuit also includes a tri-state inverter. The output of the test path is input to the feedback node of the D-type latch and also input to the tri-state inverter. The functional path is clocked by pulses generated by a pulse generator according to a system clock. The test path is clocked by a test clock generated according to a test enable signal and the system clock. When the test enable signal is enabled, the generation of the pulses is disabled.

Abstract: A dual power rail word line driver for driving a word line of a memory array according to a predecode signal from a decoder powered by a first supply voltage is provided. A signal buffering unit is coupled between the word line and a node. A pull-down unit is coupled between the node and a ground. A pull-up unit is coupled between the node and a second supply voltage higher than or equal to the first supply voltage. The signal buffering unit provides a word line signal corresponding to the predecode signal to the memory array via the word line when the pull-down unit is turned on by the predecode signal and a first pulse signal and the pull-up unit is turned off by a second pulse signal. There is no level shifter on a critical timing path of the dual power rail word line driver.

Abstract: An integrated circuit comprising a plurality of processing cores, characterised by comprising electrically controllable switches for controlling the supply of power to one or more of the processing cores, a memory for saving state data from at least one of the processing cores and a controller adapted to control the supply of power to one or more of the processing cores such that processing cores can be de-powered.

Abstract: A dual power rail word line driver for driving a word line of a memory array according to a predecode signal from a decoder powered by a first supply voltage is provided. A signal buffering unit is coupled between the word line and a node. A pull-down unit is coupled between the node and a ground. A pull-up unit is coupled between the node and a second supply voltage higher than or equal to the first supply voltage. The signal buffering unit provides a word line signal corresponding to the predecode signal to the memory array via the word line when the pull-down unit is turned on by the predecode signal and a first pulse signal and the pull-up unit is turned off by a second pulse signal. There is no level shifter on a critical timing path of the dual power rail word line driver.

Abstract: An integrated circuit comprising a plurality of processing cores, characterised by comprising electrically controllable switches for controlling the supply of power to one or more of the processing cores, a memory for saving state data from at least one of the processing cores and a controller adapted to control the supply of power to one or more of the processing cores such that processing cores can be de-powered.