Abstract: An electronic memory device is disclosed which utilizes silicon-on-sapphire SOS) transistors that exhibit binary states dependent upon the dose of ionizing radiation to which they are subjected. A memory utilizing such SOS transistors may have information written into it, permenently or for a short period of time, by electron-beam bombardment so that the memory operates as a PROM. The memory may also operate as a RAM when a scanning electron beam, in conjunction with appropriately applied biases, is used to read and write information at a high rate.

Abstract: A reusable solid state device is disclosed which monitors ionizing radiat. The device is a silicon-on-sapphire n-channel MOS transistor having a back-channel leakage current which is proportional to total radiation dose. To return the monitor to its original reusable state, the drain-to-source transistor bias is reduced to zero while irradiating the device to an appropriate dose level.