Patents by Inventor Joseph R. Yuhas

Joseph R. Yuhas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10175296
    Abstract: A testing arrangement is provided which comprises: a board assembly comprising (i) a first connector configured to receive a first component while the board assembly is to operate in a regular mode of operation and (ii) a second connector configured to receive a second component while the board assembly is to operate in the regular mode of operation; a first test card configured to be attached to the first connector while the board assembly is to operate in a test mode of operation; and a second test card configured to be attached to the second connector while the board assembly is to operate in the test mode of operation, wherein while the board assembly is to operate in the test mode of operation, the first test card is configured to communicate with the second test card to facilitate testing of the board assembly.
    Type: Grant
    Filed: December 7, 2016
    Date of Patent: January 8, 2019
    Assignee: Intel Corporation
    Inventors: Joseph W. Batz, Joseph R. Yuhas, Christopher Lewis, Elizabeth M. Yamada, Michael V. Hill, Ralph E. Rossknecht
  • Publication number: 20180156868
    Abstract: A testing arrangement is provided which comprises: a board assembly comprising (i) a first connector configured to receive a first component while the board assembly is to operate in a regular mode of operation and (ii) a second connector configured to receive a second component while the board assembly is to operate in the regular mode of operation; a first test card configured to be attached to the first connector while the board assembly is to operate in a test mode of operation; and a second test card configured to be attached to the second connector while the board assembly is to operate in the test mode of operation, wherein while the board assembly is to operate in the test mode of operation, the first test card is configured to communicate with the second test card to facilitate testing of the board assembly.
    Type: Application
    Filed: December 7, 2016
    Publication date: June 7, 2018
    Inventors: Joseph W. Batz, Joseph R. Yuhas, Christopher Lewis, Elizabeth M. Yamada, Michael V. Hill, Ralph E. Rossknecht