Abstract: A heat sink for a microprocessor includes a thermally conductive base having a plurality of substantially parallel, arcuate fin structures extending outwardly in a vertical direction from the thermally conductive base. The plurality of substantially parallel fin structures have a high fin density to enhance heat dissipation from the heat sink. In one embodiment, a shroud encloses the fin structures and is attached to the thermally conductive base via latches that fit into a pair of grooves in the bottom surface of the thermally conductive base. A fan is attached to the shroud to direct a convection medium through the plurality of substantially parallel fin structures. Also described is a method of fabricating a heat sink assembly.

Abstract: An apparatus and method for inhibiting EMI leakage is disclosed. In one embodiment of the present invention, an enclosure for surrounding an EMI producing device has protrusions extending from an edge of the enclosure. The protrusions are insertable into a printed circuit board to make contact with a grounding layer in the printed circuit board. In another embodiment, the enclosure is mateable with an EMI containment box, such as a Faraday cage, to fully enclose an EMI producing device.

Abstract: An apparatus and method for inhibiting EMI leakage is disclosed. In one embodiment of the present invention, an enclosure for surrounding an EMI producing device has protrusions extending from an edge of the enclosure. The protrusions are insertable into a printed circuit board to make contact with a grounding layer in the printed circuit board. In another embodiment, the enclosure is mateable with an EMI containment box, such as a Faraday cage, to fully enclose an EMI producing device.