Patents by Inventor Joseph SPINAZOLA

Joseph SPINAZOLA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10317350
    Abstract: A sample handling apparatus/technique/method for a material analyzer, which provides active, variable concentration of a sample, using a measurement marker introduced into the sample, to measurably concentrate an analyte in a liquid (e.g., water) sample. Active, variable concentration allows otherwise lower level analytes to be concentrated in a measurable way. This enables measurements at higher (e.g., concentrated) levels, which can be extrapolated to obtain their lower, original levels based on the concentration level—measured using the introduced marker as a guide. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, usable during both during the concentration and analyte measurement.
    Type: Grant
    Filed: May 29, 2015
    Date of Patent: June 11, 2019
    Assignee: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, George Allen, Andrew Hider, Danhong Li, Jon Dunphy, Joseph Spinazola
  • Publication number: 20170097311
    Abstract: A sample handling apparatus/technique/method for a material analyzer, which provides active, variable concentration of a sample, using a measurement marker introduced into the sample, to measurably concentrate an analyte in a liquid (e.g., water) sample. Active, variable concentration allows otherwise lower level analytes to be concentrated in a measurable way. This enables measurements at higher (e.g., concentrated) levels, which can be extrapolated to obtain their lower, original levels based on the concentration level—measured using the introduced marker as a guide. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, usable during both during the concentration and analyte measurement.
    Type: Application
    Filed: May 29, 2015
    Publication date: April 6, 2017
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, George ALLEN, Andrew HIDER, Danhong LI, Jon DUNPHY, Joseph SPINAZOLA
  • Publication number: 20160274042
    Abstract: A sample scanning apparatus/technique/method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.
    Type: Application
    Filed: November 11, 2014
    Publication date: September 22, 2016
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, George ALLEN, Peng LU, Joseph SPINAZOLA