Patents by Inventor Josh Gioja

Josh Gioja has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies
    Patent number: 11846653
    Abstract: A scanning probe microscope and method for resonance-enhanced detection using the scanning probe microscope uses a light source that is modulated in a range of frequencies to irradiate an interface between a probe tip of the microscope and a sample with modulated electromagnetic radiation from the light source. The vibrational response of the driven cantilever in response to the modulated electromagnetic radiation at the interface between the probe tip and the sample is then detected. The amplitude of the vibrational response of the cantilever over the entire range of modulation frequencies is measured to derive a photo-induced force microscope (PiFM) value.
    Type: Grant
    Filed: December 17, 2020
    Date of Patent: December 19, 2023
    Assignee: MOLECULAR VISTA, INC.
    Inventors: William Morrison, Derek Nowak, Josh Gioja, Sung I. Park, Thomas R. Albrecht
  • SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTION USING A RANGE OF MODULATION FREQUENCIES
    Publication number: 20230018874
    Abstract: A scanning probe microscope and method for resonance-enhanced detection using the scanning probe microscope uses a light source that is modulated in a range of frequencies to irradiate an interface between a probe tip of the microscope and a sample with modulated electromagnetic radiation from the light source. The vibrational response of the driven cantilever in response to the modulated electromagnetic radiation at the interface between the probe tip and the sample is then detected. The amplitude of the vibrational response of the cantilever over the entire range of modulation frequencies is measured to derive a photo-induced force microscope (PiFM) value.
    Type: Application
    Filed: December 17, 2020
    Publication date: January 19, 2023
    Inventors: William Morrison, Derek Nowak, Josh Gioja, Sung I. Park, Thomas R. Albrecht