Patents by Inventor Joshua Alan Sweetkind-Singer

Joshua Alan Sweetkind-Singer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11610085
    Abstract: In some examples, a prototype model that includes a representative subset of data points (e.g., inputs and output classifications) of a machine learning model is analyzed to efficiently interpret the machine learning model's behavior. Performance metrics such as a critic fraction, local explanation scores, and global explanation scores are determined. A local explanation score capture an importance of a feature of a test point to the machine learning model determining a particular class for the test point and is computed by comparing a value of a feature of a test point to values for prototypes of the prototype model. Using a similar approach, global explanation scores may be computed for features by combining local explanation scores for data points. A critic fraction may be computed to quantify a misclassification rate of the prototype model, indicating the interpretability of the model.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: March 21, 2023
    Assignee: ADOBE INC.
    Inventors: Deepak Pai, Debraj Debashish Basu, Joshua Alan Sweetkind-Singer
  • Publication number: 20200279140
    Abstract: In some examples, a prototype model that includes a representative subset of data points (e.g., inputs and output classifications) of a machine learning model is analyzed to efficiently interpret the machine learning model's behavior. Performance metrics such as a critic fraction, local explanation scores, and global explanation scores are determined. A local explanation score capture an importance of a feature of a test point to the machine learning model determining a particular class for the test point and is computed by comparing a value of a feature of a test point to values for prototypes of the prototype model. Using a similar approach, global explanation scores may be computed for features by combining local explanation scores for data points. A critic fraction may be computed to quantify a misclassification rate of the prototype model, indicating the interpretability of the model.
    Type: Application
    Filed: February 28, 2019
    Publication date: September 3, 2020
    Inventors: Deepak Pai, Debraj Debashish Basu, Joshua Alan Sweetkind-Singer