Patents by Inventor Joshua Brian Friend

Joshua Brian Friend has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
    Publication number: 20250260901
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: April 21, 2025
    Publication date: August 14, 2025
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, Jr., Benjamin Bradshaw Larson
  • Automated application of drift correction to sample studied under electron microscope
    Patent number: 12284445
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Grant
    Filed: February 9, 2024
    Date of Patent: April 22, 2025
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, Jr., Benjamin Bradshaw Larson
  • AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
    Publication number: 20240267628
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: February 9, 2024
    Publication date: August 8, 2024
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
  • Automated application of drift correction to sample studied under electron microscope
    Patent number: 11902665
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Grant
    Filed: January 26, 2022
    Date of Patent: February 13, 2024
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
  • Automated application of drift correction to sample studied under electron microscope
    Patent number: 11514586
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Grant
    Filed: August 3, 2022
    Date of Patent: November 29, 2022
    Assignee: PROTOCHIPS, INC.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
  • AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
    Publication number: 20220377244
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: August 3, 2022
    Publication date: November 24, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
  • AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
    Publication number: 20220247934
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: January 26, 2022
    Publication date: August 4, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson