Abstract: Embodiments described herein may be related to apparatuses, processes, systems, and/or techniques for using x-rays to alter or observe circuits within a semiconductor device before, during or after a test of the semiconductor device. Other embodiments may be described and/or claimed.

Abstract: A distillation device may comprise a source fluid input and an evaporator in fluid communication therewith. The device may further comprise a compressor having an impeller coupled to a motor, the compressor having a low pressure inlet for vapor from the evaporator and a high pressure outlet for compressed vapor. The device may further comprise at least one temperature sensor configured to monitor temperature of vapor in the inlet and a condenser in heat transfer relationship with exterior surfaces of the evaporator and in fluid communication with the compressor outlet. The device may further comprise a controller configured to govern rotation speed of the impeller with an impeller motor command based on a calibrated motor speed for the distillation device. The controller may be configured to determine an adjusted motor speed for a next use of the device and overwrite the calibrated motor speed with the adjusted motor speed.