Abstract: A design for a universal telescoping swing gate can be sized to obscure a wide range of openings while accommodating a multitude of installation options to make the gate versatile under many conditions. The swing gate can have a frame with a pivot member rotatable about a mounting seat between an open configuration and a closed configuration. The frame can have first and second telescoping members adjustable along an extension axis between a collapsed state and a fully extended state for changing the frame length so the gate can be quickly furnished to different sized openings. The gate can be spring loaded to bias the frame to a nominally closed position to reduce the chance for human error among workers. The gate can also be sized to have the structural rigidity to comply with OSHA requirements for handrails and guardrails around a walking-working surface.

Abstract: A design for a universal telescoping swing gate can be sized to obscure a wide range of openings while accommodating a multitude of installation options to make the gate versatile under many conditions. The swing gate can have a frame with a pivot member rotatable about a mounting seat between an open configuration and a closed configuration. The frame can have first and second telescoping members adjustable along an extension axis between a collapsed state and a fully extended state for changing the frame length so the gate can be quickly furnished to different sized openings. The gate can be spring loaded to bias the frame to a nominally closed position to reduce the chance for human error among workers. The gate can also be sized to have the structural rigidity to comply with OSHA requirements for handrails and guardrails around a walking-working surface.

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.