Patents by Inventor Josiah A. Bartlett

Josiah A. Bartlett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210263074
    Abstract: A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.
    Type: Application
    Filed: June 11, 2019
    Publication date: August 26, 2021
    Applicant: Tektronix, Inc.
    Inventors: Karl A. Rinder, David A. Sailor, Josiah A. Bartlett
  • Patent number: 11079408
    Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.
    Type: Grant
    Filed: October 19, 2018
    Date of Patent: August 3, 2021
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett
  • Patent number: 11041880
    Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
    Type: Grant
    Filed: October 16, 2018
    Date of Patent: June 22, 2021
    Assignee: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Publication number: 20210148951
    Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
    Type: Application
    Filed: November 16, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Josiah A. Bartlett, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska
  • Patent number: 10962566
    Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
    Type: Grant
    Filed: January 7, 2019
    Date of Patent: March 30, 2021
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg
  • Publication number: 20190353683
    Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.
    Type: Application
    Filed: October 19, 2018
    Publication date: November 21, 2019
    Applicant: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett
  • Publication number: 20190170790
    Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
    Type: Application
    Filed: October 16, 2018
    Publication date: June 6, 2019
    Applicant: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Patent number: 10215776
    Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
    Type: Grant
    Filed: October 26, 2015
    Date of Patent: February 26, 2019
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg
  • Publication number: 20170115325
    Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
    Type: Application
    Filed: October 26, 2015
    Publication date: April 27, 2017
    Inventors: Julie A. Campbell, Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg
  • Patent number: 9581675
    Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: February 28, 2017
    Assignee: TEKTRONIX, Inc.
    Inventors: Laudie J. Doubrava, Josiah A. Bartlett
  • Patent number: 8810258
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: January 4, 2013
    Date of Patent: August 19, 2014
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Michael D. Stevens
  • Patent number: 8791706
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: July 29, 2014
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Michael Duane Stevens
  • Patent number: 8723530
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: April 1, 2013
    Date of Patent: May 13, 2014
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott R. Jansen, Kenneth P. Dobyns, Michael Duane Stevens
  • Publication number: 20140058693
    Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.
    Type: Application
    Filed: February 21, 2013
    Publication date: February 27, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: Laudie J. Doubrava, Josiah A. Bartlett
  • Patent number: 8611436
    Abstract: A balun structure is disclosed having positive and negative going signal paths coupled to a ninety degree hybrid. The positive signal path has a circuit trace and a phase shaper structure that provides three hundred and sixty degrees of phase shift at Port 1 of the hybrid. The negative going signal path has a circuit trace and a second order phase shaper that provides four hundred and fifty degrees of phase shift at Port 2 of the hybrid. Port 1 is coupled to Port 3 of the hybrid and functions as an output port. The first order phase shaper and the second order phase shaper compensate for the signal loss caused by a signal cable coupled to the output port and provide a frequency band from DC to at least 15 GHz and a transient response having less than ten percent pre-shoot.
    Type: Grant
    Filed: December 31, 2011
    Date of Patent: December 17, 2013
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, James S. Lamb, Josiah A. Bartlett
  • Patent number: 8564308
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: October 22, 2013
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott R. Jansen, Kenneth P. Dobyns, Michael Duane Stevens
  • Publication number: 20130245977
    Abstract: A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display. An electrical signal under test is sampled and digitized, and stored in an acquisition memory as a data record. A display device draws a waveform associated with the signal under test. After the acquisition of the digital samples is stopped, a user selects trigger criteria using trigger controls such as a trigger level control. A trigger circuit detects a post-acquisition trigger event in the data record based on the trigger criteria causing an automatic adjustment of the waveform to conform to a time of the post-acquisition trigger event. One or more configurable trigger controls can be used to adjust a display of post-acquisition trigger events and waveforms. Upon resumption of the live-acquisition of data, the live waveform conforms to the newly selected trigger criteria as previewed during the post-acquisition mode.
    Type: Application
    Filed: May 1, 2013
    Publication date: September 19, 2013
    Applicant: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Kristie L. Veith, Steven K. Sullivan
  • Patent number: 8456173
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable with the signal cable coupled to a signal processing instrument via an input node. The input node is coupled to an input current amplifier via input circuitry. The input circuitry provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The termination of the resistive center conductor signal cable in the signal processing instrument provides a signal acquisition system where the capacitive loading of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuitry resulting in an increase in the signal acquisition system bandwidth.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: June 4, 2013
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Josiah A. Bartlett, Ira G. Pollock, Lester L. Larson
  • Patent number: 8436624
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: May 7, 2013
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott R. Jansen, Kenneth P. Dobyns, Michael Duane Stevens
  • Publication number: 20130022133
    Abstract: A balun structure is disclosed having positive and negative going signal paths coupled to a ninety degree hybrid. The positive signal path has a circuit trace and a phase shaper structure that provides three hundred and sixty degrees of phase shift at Port 1 of the hybrid. The negative going signal path has a circuit trace and a second order phase shaper that provides four hundred and fifty degrees of phase shift at Port 2 of the hybrid. Port 1 is coupled to Port 3 of the hybrid and functions as an output port. The first order phase shaper and the second order phase shaper compensate for the signal loss caused by a signal cable coupled to the output port and provide a frequency band from DC to at least 15 GHz and a transient response having less than ten percent pre-shoot.
    Type: Application
    Filed: December 31, 2011
    Publication date: January 24, 2013
    Applicant: TEKTRONIX, INC.
    Inventors: Daniel G. Knierim, James S. Lamb, Josiah A. Bartlett