Patents by Inventor Jouni Pyythiä

Jouni Pyythiä has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6797960
    Abstract: A semiconductor radiation imaging assembly comprises a semiconductor imaging device including at least one image element detector. The imaging device is arranged to receive a bias for forming the at least one image element detector. The assembly also includes bias monitoring means for monitoring the bias for determining radiation incident on the image element detector. Preferably, the imaging device comprises a plurality of image element detectors the bias for at least some of which is monitored for determining incident radiation. More preferably, the bias for all the detector elements is monitored.
    Type: Grant
    Filed: November 27, 2001
    Date of Patent: September 28, 2004
    Assignee: Simage Oy
    Inventors: Konstantinos Evangelos Spartiotis, Stefan Jurthe, Jouni Pyythiä