Abstract: Aspects of the invention include a non-destructive bond line thickness measurement of thermal interface material on silicon packages. A non-limiting example computer-implemented method includes receiving a chip mounted on a laminate and depositing a high-density material on the chip. The computer-implemented method deposits a thermal interface material on the chip and lids the chip, and the laminate with a lid. The computer-implemented method X-rays the lid, the chip, and the laminate to produce an X-ray and measures, using a processor, from the X-ray a bond line thickness of the TIM as a distance from a bottom of the lid to a top surface of the high-density material.

Abstract: Aspects of the invention include a non-destructive bond line thickness measurement of thermal interface material on silicon packages. A non-limiting example computer-implemented method includes receiving a chip mounted on a laminate and depositing a high-density material on the chip. The computer-implemented method deposits a thermal interface material on the chip and lids the chip, and the laminate with a lid. The computer-implemented method X-rays the lid, the chip, and the laminate to produce an X-ray and measures, using a processor, from the X-ray a bond line thickness of the TIM as a distance from a bottom of the lid to a top surface of the high-density material.

Abstract: Methods of producing coolant-cooled heat sinks with a coolant-carrying compartment between a cover and a heat transfer base are provided. The heat transfer base includes a heat transfer surface to couple to a component to be cooled, and a plurality of thermally-conductive fins extending into the coolant-carrying compartment from a surface of the heat transfer base opposite to the heat transfer surface. The method includes positioning a screen with openings over the plurality of thermally-conductive fins, between the plurality of thermally-conductive fins and the cover, and providing a joining material over the screen, between the screen and the cover. The method also includes joining the plurality of thermally-conductive fins to the cover across the screen using the joining material, where the screen facilitates retaining the joining material over the plurality of thermally-conductive fins during the joining.

Abstract: The invention relates to a test structure and methods of detecting electrical defects between adjacent metal contacts using such test structure at the first metal level within a semiconductor device. The test structure includes dual first metal level comb structures each having extending lines that are in direct electrical communication with contacts residing in the semiconductor. The extending lines of the first metal comb are interlaced with extending lines on the second metal comb such that adjacent metal contacts are in electrical communication with different metal combs. In this manner, upon testing for electrical continuity, an electrical current passing from the first metal comb to the second metal comb indicates an electrical defect existing between adjacent metal contacts.

Abstract: A method for forming floating gate regions in non-volatile memory cells each having a floating gate and a control gate is disclosed. First, a plurality of isolation structures in a substrate extending above and below a surface of the substrate is formed. Second, a floating gate layer on the substrate over and between at least a portion of the isolation structures is formed. Finally, the floating gate layer is planarized down to the isolation structures for forming a plurality of the floating gate regions isolated by the isolation structures.