Patents by Inventor Ju-Chung Chen

Ju-Chung Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7092081
    Abstract: An apparatus for measuring the optoelectric properties of an organic light-emitting device (OLED) comprising a platform, a goniometer, a three-axis moving device and a computer. The goniometer is disposed on one side of the platform and an OLED is disposed on the goniometer. The three-axis moving device is disposed on another side of the platform. The photo-detector is disposed on the three-axis moving device with the photo-detector toward the OLED on the goniometer. The goniometer, the three-axis moving device and the photo-detector are connected to the computer.
    Type: Grant
    Filed: December 30, 2003
    Date of Patent: August 15, 2006
    Assignee: RiTdisplay Corporation
    Inventors: Yen-Lin Wang, Ju-Chung Chen, Shu-Shin Lin
  • Publication number: 20050146713
    Abstract: An apparatus for measuring the optoelectric properties of an organic light-emitting device (OLED) comprising a platform, a goniometer, a three-axis moving device and a computer. The goniometer is disposed on one side of the platform and an OLED is disposed on the goniometer. The three-axis moving device is disposed on another side of the platform. The photo-detector is disposed on the three-axis moving device with the photo-detector toward the OLED on the goniometer. The goniometer, the three-axis moving device and the photo-detector are connected to the computer.
    Type: Application
    Filed: December 30, 2003
    Publication date: July 7, 2005
    Inventors: Yen-Lin Wang, Ju-Chung Chen, Shu-Shin Lin
  • Patent number: 6897431
    Abstract: A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.
    Type: Grant
    Filed: February 12, 2003
    Date of Patent: May 24, 2005
    Assignee: RiTdisplay Corporation
    Inventors: Ming-Hsin Wu, Ju-Chung Chen, Shu-Shin Lin, Yen-Lin Wang
  • Patent number: 6858831
    Abstract: An apparatus for measuring optoelectronic characterstics of an organic light emitting diode, comprising a computer, a power supply and a cavity. The cavity comprises a tooling, on which at least one photodiode is mounted. The computer is used to control the power supply for lighting up the organic light emitting diode, so as to control the optoelectronic characteristic measuring equipment for measuring a brightness generated by the organic light emitting diode. Thereby, the automatic measurement is attained.
    Type: Grant
    Filed: February 10, 2003
    Date of Patent: February 22, 2005
    Assignee: RiTdisplay Corporation
    Inventors: Ming-Hsin Wu, Ju-Chung Chen, Shu-Shin Lin, Yen-Lin Wang
  • Patent number: 6808949
    Abstract: The testing method of OLED panels for all pixels on are provided. The methods include positioning anisotropic conductive films and conductive plates over a set of exposed first electrodes and a set of exposed second electrodes. Through the anisotropic conductive film and the conductive plate, the set of first electrodes and the set of second electrodes conduct. Thereafter, the set of first electrodes is connected to a first voltage and the set of second electrodes is connected to a second voltage. Through the voltage difference between the first voltage and the second voltage, all the inside the OLED panels are lit to perform the test.
    Type: Grant
    Filed: December 13, 2002
    Date of Patent: October 26, 2004
    Assignee: RiTdisplay Corporation
    Inventors: Shu-Hsin Lin, Ming-Hsin Wu, Ju-Chung Chen, Yen-Lin Wang
  • Publication number: 20040155173
    Abstract: An apparatus for measuring optoelectronic characterstics of an organic light emitting diode, comprising a computer, a power supply and a cavity. The cavity comprises a tooling, on which at least one photodiode is mounted. The computer is used to control the power supply for lighting up the organic light emitting diode, so as to control the optoelectronic characteristic measuring equipment for measuring a brightness generated by the organic light emitting diode. Thereby, the automatic measurement is attained.
    Type: Application
    Filed: February 10, 2003
    Publication date: August 12, 2004
    Inventors: Ming-Hsin Wu, Ju-Chung Chen, Shu-Shin Lin, Yen-Lin Wang
  • Publication number: 20040155174
    Abstract: A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.
    Type: Application
    Filed: February 12, 2003
    Publication date: August 12, 2004
    Inventors: MING-HSIN WU, JU-CHUNG CHEN, SHU-SHIN LIN, YEN-LIN WANG
  • Publication number: 20030113942
    Abstract: The testing methods of OLED panels for all pixels on are provided. The methods include positioning anisotropic conductive films and conductive plates over a set of exposed first electrodes and a set of exposed second electrodes. Through the anisotropic conductive film and the conductive plate, the set of first electrodes and the set of second electrodes conduct. Thereafter, the set of first electrodes is connected to a first voltage and the set of second electrodes is connected to a second voltage. Through the voltage difference between the first voltage and the second voltage, all the diodes inside the OLED panels are lit to perform the test.
    Type: Application
    Filed: December 13, 2002
    Publication date: June 19, 2003
    Inventors: SHU-HSIN LIN , MING-HSIN WU , JU-CHUNG CHEN , YEN-LIN WANG