Patents by Inventor Ju Hao CHIEN

Ju Hao CHIEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect displaying method
    Patent number: 11416979
    Abstract: A defect displaying method is provided in the disclosure. The method comprises acquiring defect group information from an image of a wafer, wherein the defect group information includes a set of correlations between a plurality of defects identified from the image and one or more corresponding assigned defect types and displaying at least some of the plurality of defects according to their corresponding assigned defect types.
    Type: Grant
    Filed: January 18, 2018
    Date of Patent: August 16, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Wei Fang, Cho Huak Teh, Ju Hao Chien, Yi-Ying Wang, Shih-Tsung Chen, Jian-Min Liao, Chuan Li, Zhaohui Guo, Pang-Hsuan Huang, Shao-Wei Lai, Shih-Tsung Hsu
  • DEFECT DISPLAYING METHOD
    Publication number: 20190370950
    Abstract: A defect displaying method is provided in the disclosure. The method comprises acquiring defect group information from an image of a wafer, wherein the defect group information includes a set of correlations between a plurality of defects identified from the image and one or more corresponding assigned defect types and displaying at least some of the plurality of defects according to their corresponding assigned defect types.
    Type: Application
    Filed: January 18, 2018
    Publication date: December 5, 2019
    Inventors: Wei FANG, Cho Huak TEH, Ju Hao CHIEN, Yi-Ying WANG, Shih-Tsung CHEN, Jian-Min LIAO, Chuan LI, Zhaohui GUO, Pang-Hsuan HUANG, Shao-Wei LAI, Shih-Tsung HSU