Abstract: A light detecting method is provided. The light detecting method includes following steps. A light beam is sensed to generate a photocurrent. A predetermined current is subtracted from the photocurrent. The photocurrent is converted to a voltage.

Abstract: A light detecting circuit and a light detecting method thereof are provided. The light detecting circuit includes a first resistor, a light sensor, a current source, and a first current mirror. The light sensor generates a corresponding photocurrent according to the illumination while being illuminated by the high brightness light beam. By dividing the photocurrent corresponding to the low brightness light beam from the photocurrent through the current source, the light detecting circuit can mainly detects the high brightness light beam, so that the detecting accuracy can be enhanced. Accordingly, when being applied to detect the high brightness light beam, the light detecting circuit can provide a sensing voltage in a wide enough range and a large enough sense scale, so that the sensing voltage is easy to be distinguished by the rear stage.

Abstract: A pixel circuitry for a display apparatus is provided herein. The pixel circuitry includes a first storage element, and a switching element composed of a plurality of switches. The first storage element has a first terminal receiving a pixel signal and a second terminal coupled to a first voltage. The first storage element is used for storing the pixel signal. The switching element includes a first switch and a second switch respectively conducted in response to a first signal and a second signal. Each of the first switch and the second switch has an input terminal coupled to a data line and an output terminal coupled to the first storage element. The cooperation of the first switch and the second switch has benefit of delivering the pixel signal without influence of body effect.

Abstract: A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.

Abstract: A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.

Abstract: A light detecting circuit and a light detecting method thereof are provided. The light detecting circuit includes a first resistor, a light sensor, a current source, and a first current mirror. The light sensor generates a corresponding photocurrent according to the illumination while being illuminated by the high brightness light beam. By dividing the photocurrent corresponding to the low brightness light beam from the photocurrent through the current source, the light detecting circuit can mainly detects the high brightness light beam, so that the detecting accuracy can be enhanced. Accordingly, when being applied to detect the high brightness light beam, the light detecting circuit can provide a sensing voltage in a wide enough range and a large enough sense scale, so that the sensing voltage is easy to be distinguished by the rear stage.

Abstract: A pixel circuitry for a display apparatus is provided herein. The pixel circuitry includes a first storage element, and a switching element composed of a plurality of switches. The first storage element has a first terminal receiving a pixel signal and a second terminal coupled to a first voltage. The first storage element is used for storing the pixel signal. The switching element includes a first switch and a second switch respectively conducted in response to a first signal and a second signal. Each of the first switch and the second switch has an input terminal coupled to a data line and an output terminal coupled to the first storage element. The cooperation of the first switch and the second switch has benefit of delivering the pixel signal without influence of body effect.

Abstract: A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.

Abstract: A pixel unit and driving method thereof are disclosed. The pixel unit includes a switch, a storage element and a first multiplexer. The switch develops a charge transfer path according to a scan signal associated with a scan line. The storage element has a first electrode coupled to the switch and a second electrode coupled to a reference voltage for receiving a pixel voltage via the charge transfer path. The first multiplexer is coupled to the second electrode of the storage element for selectively providing the reference voltage with a default value and the reference voltage with a determined value to the second electrode of the storage element according to a modulating signal. The driving method enlarges the voltage range of the first electrode of the storage element for enhancing the contrast ratio of the display panel.

Abstract: A heating system for a display panel is provided herein, wherein the display panel has a display area. The heating system includes a sensor, a temperature controlling device, and a heating element. The sensor is used for sensing the temperature of the display panel. The temperature controlling device provides a control signal according to the temperature of the display panel. The heating element heats the display panel according to the control signal, and the heating element is a patterned circuitry disposed on a peripheral region of the display area.

Abstract: The LCoS panel includes a display region, an odd and an even data drivers, and a data-line testing unit. The display region includes a plurality of pixel cells formed at each intersection of a plurality of scan lines and a plurality of data lines. The data lines include a plurality of odd data lines coupled to a plurality of first data channels of the odd data driver, and the data lines include a plurality of even data lines coupled to a plurality of second data channels of the even data driver. The odd and the even data drivers are arranged in a first side of the display region. The data-line testing unit is arranged in a second side of the display region opposite to the first side for selectively outputting a data-line testing signal corresponding to one of the data lines according to a data-line selecting signal.

Abstract: A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.