Abstract: A circular polarizer detection device for detecting a circular polarizer-to-be-detected including a first linear polarizer and a first wave plate is provided. The first linear polarizer has a first transmission axis, the first wave plate has a first fast axis, and there are a preset angle and an error angle between the first transmission axis and the first fast axis. The circular polarizer detection device includes a light source system, a second wave plate and an optical phase demodulation system. A first beam provided by the light source system is converted into a beam-to-be-detected through the circular polarizer-to-be-detected. The beam-to-be-detected enters the rotating second wave plate and then is converted into a second beam. The optical phase demodulation system receives the second beam, generates a phase difference curve, and analyzes a relationship between the rotation angle and the error angle. A circular polarizer detection method is also provided.

Abstract: The present invention relates to a linear polarization component detection system. The system includes elements of a light source configured to emit a detection beam propagating along an optical path; a linear polarization component to be tested configured in the optical path and providing for the detection beam to pass through and transform into a polarized beam; a wave plate configured in the optical path and providing for the polarized beam to pass through and transform into a polarized interference beam; and a phase retrieval device configured to receive the polarized interference beam and sense a light intensity signal from the polarized interference beam.

Abstract: An optical alignment detection apparatus is adapted to detect a wave plate to be detected. The optical alignment detection apparatus includes a light source system, a first linear polarizer, a second linear polarizer, and an optical detector. The wave plate to be detected is rotatably disposed between the first linear polarizer and the second linear polarizer. The beam is converted into an alignment beam through the first linear polarizer, the wave plate to be detected, and the second linear polarizer, and is received by the optical detector. When the wave plate to be detected rotates, an intensity of the alignment beam received by the optical detector would change periodically. An angle of an optical axis between the wave plate to be detected and the second linear polarizer can be judged according to the periodical change of the intensity of the beam, so as to achieve precise alignment.

Abstract: A circular polarizer detection device for detecting a circular polarizer-to-be-detected including a first linear polarizer and a first wave plate is provided. The first linear polarizer has a first transmission axis, the first wave plate has a first fast axis, and there are a preset angle and an error angle between the first transmission axis and the first fast axis. The circular polarizer detection device includes a light source system, a second wave plate and an optical phase demodulation system. A first beam provided by the light source system is converted into a beam-to-be-detected through the circular polarizer-to-be-detected. The beam-to-be-detected enters the rotating second wave plate and then is converted into a second beam. The optical phase demodulation system receives the second beam, generates a phase difference curve, and analyzes a relationship between the rotation angle and the error angle. A circular polarizer detection method is also provided.

Abstract: The present invention relates to a linear polarization component detection system. The system includes elements of a light source configured to emit a detection beam propagating along an optical path; a linear polarization component to be tested configured in the optical path and providing for the detection beam to pass through and transform into a polarized beam; a wave plate configured in the optical path and providing for the polarized beam to pass through and transform into a polarized interference beam; and a phase retrieval device configured to receive the polarized interference beam and sense a light intensity signal from the polarized interference beam.

Abstract: The tactile sensor of the present disclosure is an indirect optical sensor, comprising a frame, a sensing plate, a single beam LED light source, a miniature camera, and a grating plate in the sensing plate and the single light source illuminates the grating plate. Geometric interference fringes caused by the shadows of gratings and gratings, images taken by a miniature camera, through an innovative instantaneous steps phase shifting technique, which eliminates the need for any mechanical phase shifting device to detect the pressure and space. The position is measured and has fast and accurate tactile sensing. The advantage of this method is that directly shooting the moiré image while calculating the spatial position, temperature, and pressure. Instantaneous steps phase shifting technique can solve the problems of traditional mechanical stepping, non-instant and complex operation problems.

Abstract: The present invention discloses a wavelength modulation heterodyne light source, which comprises: a modulation unit, a wavelength modulated light source and a birefringent crystal. The modulation unit produces a triangular or sine wave modulating signal, and transmits the modulating signal to the wavelength modulated light source to generate a wavelength modulated light signal, then the modulated light signal is refracted by the birefringent crystal with two different optical paths caused by the two different refractivity of the crystal to generate a heterodyne light. With the application of the present invention, the heterodyne light source can be made to a relatively small size and save much cost compared with known heterodyne light sources at present.

Abstract: A SPR measuring device is proposed. The measuring device includes a circularly polarized heterodyne light source that produces a circularly polarized heterodyne light beam, a beam splitting element that splits the circularly polarized heterodyne light beam into a reference beam and a signal beam, a first light sensing unit that receives a reference light intensity of the reference beam, a SPR sensor that receives the signal beam and reflects a reflected signal beam, a second light sensing unit that receives a reflected light intensity of the reflected signal beam and a processing circuit that calculates a phase difference between the reference light intensity and the reflected light intensity. A phase change caused by SPR of an incident light is sensitively represented by the circularly polarized heterodyne light beam. Thus tiny changes in physical quantities of analytes are measured easily.

Abstract: The apparatus and method for measuring displacement according to the present invention includes a first beam and a second beam. A first reflection structure reflects a first beam to the surface of an object under test; and a second reflection structure reflects a second beam to the surface of the object under test. The reflected first beam and the reflected second beam have an optical path difference. The object under test scatters a scattering beam of gathering the first and second beams. The scattering beam has an interference signal. A photodetector receives the interference signal of the scattering beam. Then an operational unit receives and computes the interference signal for producing a displacement value. By using the first and second reflection structures, the first and second beams split from an incident beam produce an optical path difference. Thereby, the structure of the apparatus for measuring displacement can be simplified.

Abstract: A SPR measuring device is proposed. The measuring device includes a circularly polarized heterodyne light source that produces a circularly polarized heterodyne light beam, a beam splitting element that splits the circularly polarized heterodyne light beam into a reference beam and a signal beam, a first light sensing unit that receives a reference light intensity of the reference beam, a SPR sensor that receives the signal beam and reflects a reflected signal beam, a second light sensing unit that receives a reflected light intensity of the reflected signal beam and a processing circuit that calculates a phase difference between the reference light intensity and the reflected light intensity. A phase change caused by SPR of an incident light is sensitively represented by the circularly polarized heterodyne light beam. Thus tiny changes in physical quantities of analytes are measured easily.

Abstract: The apparatus and method for measuring displacement according to the present invention includes a first beam and a second beam. A first reflection structure reflects a first beam to the surface of an object under test; and a second reflection structure reflects a second beam to the surface of the object under test. The reflected first beam and the reflected second beam have an optical path difference. The object under test scatters a scattering beam of gathering the first and second beams. The scattering beam has an interference signal. A photodetector receives the interference signal of the scattering beam. Then an operational unit receives and computes the interference signal for producing a displacement value. By using the first and second reflection structures, the first and second beams split from an incident beam produce an optical path difference. Thereby, the structure of the apparatus for measuring displacement can be simplified.

Abstract: This invention relates to a scanning ultrasound detection device using two-wave mixing in photorefractive crystal interferometry. An interferometer with two-wave mixing in photorefractive crystal, and cooperates with a confocal lenses module to perform a scan and inspection of the surface of a target. A rotating unit is used for directing a signal beam for detection to be incident upon different locations of the target. The confocal lens module is used to compensate any changes of reflection path caused by the signal beam having different incident angles. Hence, a reflected signal beam and a reference beam can strike on a photo detector.

Abstract: This invention relates to a scanning ultrasound detection device using two-wave mixing in photorefractive crystal interferometry. An interferometer with two-wave mixing in photorefractive crystal, and cooperates with a confocal lenses module to perform a scan and inspection of the surface of a target. A rotating unit is used for directing a signal beam for detection to be incident upon different locations of the target. The confocal lens module is used to compensate any changes of reflection path caused by the signal beam having different incident angles. Hence, a reflected signal beam and a reference beam can strike on a photo detector.