Patents by Inventor Juan-Antonio OCON-GARRIDO

Juan-Antonio OCON-GARRIDO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Overheat protection circuit and method in an accelerated aging test of an integrated circuit
    Patent number: 10371745
    Abstract: To include in a device a controller to control operation of the device in a normal-operation mode and in a test mode for performing one or more tests including an accelerated aging test, a temperature sensor to measure operating temperature of the device, and an overheat protection circuit to prevent overheating of the memory device during the test mode. With this overheat protection circuit, a device may undergo an efficient and reliable accelerated aging test with reduced or non-existent, possibility of suffering an overheat damage.
    Type: Grant
    Filed: January 23, 2014
    Date of Patent: August 6, 2019
    Assignee: Micron Technology, Inc.
    Inventors: Ronny Schneider, Martin Brox, Juan-Antonio Ocon-Garrido
  • OVERHEAT PROTECTION CIRCUIT AND METHOD IN AN ACCELERATED AGING TEST OF AN INTEGRATED CIRCUIT
    Publication number: 20150204941
    Abstract: To include in a device a controller to control operation of the device in a normal-operation mode and in a test mode for performing one or more tests including an accelerated aging test, a temperature sensor to measure operating temperature of the device, and an overheat protection circuit to prevent overheating of the memory device during the test mode. With this overheat protection circuit, a device may undergo an efficient and reliable accelerated aging test with reduced or non-existent, possibility of suffering an overheat damage.
    Type: Application
    Filed: January 23, 2014
    Publication date: July 23, 2015
    Inventors: Ronny SCHNEIDER, Martin BROX, Juan-Antonio OCON-GARRIDO