Patents by Inventor Juan Ivaldi

Juan Ivaldi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9995627
    Abstract: A spectroscopic scanning device, a portable spectroscopic scanning system, and methods for using the spectroscopic scanning device are described that include at least one focusing element configured to collect light, a beam-steering element configured to direct a portion of the collected light from the at least one focusing element, and a detector configured to receive the directed light from the beam-steering element, wherein the beam-steering element is operable to successively select portions of light from a plurality of locations within its field of regard.
    Type: Grant
    Filed: July 31, 2014
    Date of Patent: June 12, 2018
    Assignee: SMITHS DETECTION INC.
    Inventors: Maxim Frayer, Juan Ivaldi, Peng Zou
  • Publication number: 20160033393
    Abstract: A spectroscopic scanning device, a portable spectroscopic scanning system, and methods for using the spectroscopic scanning device are described that include at least one focusing element configured to collect light, a beam-steering element configured to direct a portion of the collected light from the at least one focusing element, and a detector configured to receive the directed light from the beam-steering element, wherein the beam-steering element is operable to successively select portions of light from a plurality of locations within its field of regard.
    Type: Application
    Filed: July 31, 2014
    Publication date: February 4, 2016
    Inventors: Maxim Frayer, Juan Ivaldi, Peng Zou
  • Patent number: 8255839
    Abstract: A system and method are provided for securely manufacturing a device at a foundry. For example, an integrated circuit chip may be securely fabricated at an untrusted foundry by later verifying authenticity of the integrated circuit chip based on a valid usage of an original source code file associated with a semiconductor manufacturing process of the integrated circuit chip. The integrated circuit chip may be authenticated by matching a first set of unique daughter codes generated during fabrication with a second set of unique daughter codes generated independently by some entity other than the foundry. In this way, a trusted electronics integrator may compare the first and second unique daughter codes to nondestructively determine whether the integrated circuit chip is a trusted device or a tampered device.
    Type: Grant
    Filed: October 14, 2008
    Date of Patent: August 28, 2012
    Assignee: ASML Holding N.V.
    Inventor: Juan Ivaldi
  • Patent number: 5308982
    Abstract: A method for determining concentration of an analyte in a sample includes generating a spectrum of a selected analyte and interferents, generating a spectrum of an unknown sample, computing first and second derivatives of the sample spectrum, deriving a matrix model that includes the analyte spectrum and the derivatives, and applying the matrix model to the sample spectrum so as to yield a parameter representing concentration of the selected analyte in the unknown sample. Multiple linear least squares regression is utilized to fit the model and calculate the parameter.
    Type: Grant
    Filed: October 5, 1992
    Date of Patent: May 3, 1994
    Assignee: Perkin-Elmer Corporation
    Inventors: Juan Ivaldi, David H. Tracy, Robert Hoult, Richard Spragg