Patents by Inventor Juan Ocon

Juan Ocon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SEMICONDUCTOR MEMORY AND METHOD FOR TESTING SEMICONDUCTOR MEMORIES
    Publication number: 20080080265
    Abstract: A semiconductor memory and method for testing semiconductor memory is disclosed. One embodiment provides a method including activating a first master word line. An electric voltage difference between the first master word line and an adjacent master word line is generated. The leakage current between the first master word line and the adjacent master word line is measured.
    Type: Application
    Filed: September 28, 2007
    Publication date: April 3, 2008
    Applicant: QIMONDA AG
    Inventors: Frank Fischer, Thomas Lucia, Juan Ocon, Manfred Proell
  • Integrated Semiconductor Memory with a Test Function and Method for Testing an Integrated Semiconductor Memory
    Publication number: 20070253264
    Abstract: An integrated semiconductor memory with a test function comprises a bit line pair having a first end and a second end. A voltage generation circuit having a first connection and a second connection is coupled to the first end of the bit line pair. A plurality of memory cells are connected to a bit line of the bit line pair between the first end and second end of the bit line pair. A controllable switch is connected between the second end of the bit line pair.
    Type: Application
    Filed: April 26, 2007
    Publication date: November 1, 2007
    Inventors: Manfred Proell, Juan Ocon, Frank Ertl, Stephan Schroeder