Patents by Inventor Juan Ren

Juan Ren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240117740
    Abstract: Disclosed is a detection device for a working surface. The detection device (100) comprises: a plurality of hydraulic supports (101), a laser ranging set (102), a displacement sensor (103), a hydroelectric signal conversion module (104), and a support controller (105) which are disposed on a working surface. The laser ranging set (102) is disposed below a top beam of a first target hydraulic support among the plurality of hydraulic supports and parallel to a post of the first target hydraulic support, and is configured to determine error length and send the error length to the hydroelectric signal conversion module (104). The displacement sensor (103) is configured to at least obtain the degrees of inclination of the hydraulic supports (101) and send the degrees of inclination to the hydroelectric signal conversion module (104).
    Type: Application
    Filed: August 17, 2021
    Publication date: April 11, 2024
    Applicant: TAIYUAN UNIVERSITY OF TECHNOLOGY
    Inventors: Ziming KOU, Juan WU, Qichao REN, Tengyan HOU, Peng XU, Yuchen LI, Kaiyu GUO, Mingsong YUAN, Baoqin WANG, Lele LUAN
  • Patent number: 11929663
    Abstract: In an embodiment, an apparatus is disclosed that includes a power management integrated circuit (PMIC). The PMIC includes a voltage regulator supplied by a first power source and configured to generate a first output and a charge pump supplied by a second power source and configured to generate a second output. A bias voltage output of the power management integrated circuit is generated based at least in part on the first output and the second output. The charge pump is configured to adjust the second output based at least in part on a comparison between the bias voltage output and a reference voltage.
    Type: Grant
    Filed: November 16, 2021
    Date of Patent: March 12, 2024
    Assignee: Renesas Electronics America Inc.
    Inventors: Juan Qiao, Chenxiao Ren, Yue Wang
  • Patent number: 11928830
    Abstract: Disclosed are methods and systems for generating three-dimensional reconstructions of environments. A system, for example, may include a housing having an image sensor directed in a first direction and a distance sensor directed in a second direction and a control unit including a processor and a memory storing instructions. The processor may be configured to execute the instructions to: generate a first 3D model of an environment; generate a plurality of revolved 3D models by revolving the first 3D model relative to the image sensor to a plurality of positions within a predetermined angular range; match a set of distance values to one of the revolved 3D models; determine an angular position of the second direction relative to the first direction; and generate a 3D reconstruction of the environment.
    Type: Grant
    Filed: December 22, 2021
    Date of Patent: March 12, 2024
    Assignee: Honeywell International Inc.
    Inventors: Zhiguo Ren, Alberto Speranzon, Carl Dins, Juan Hu, Zhiyong Dai, Vijay Venkataraman
  • Patent number: 10041970
    Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.
    Type: Grant
    Filed: July 14, 2015
    Date of Patent: August 7, 2018
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Qingze Zou, Juan Ren, Jiangbo Liu
  • Publication number: 20170199219
    Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.
    Type: Application
    Filed: July 14, 2015
    Publication date: July 13, 2017
    Applicant: Rutgers, The State University of New Jersey
    Inventors: Qingze Zou, Juan Ren, Jiangbo Liu
  • Patent number: 8973161
    Abstract: A control-based approach is provided for achieving accurate indentation quantification in broadband and in-liquid nanomechanical property measurements using atomic force microscope (AFM). Accurate indentation measurement is desirable for probe-based material property characterization because the force applied and the indentation generated are the fundamental physical variables that are measured in the characterization process. Large measurement errors, however, occur when the measurement frequency range becomes large (i.e., broadband), or the indentation is measured in liquid on soft materials. Such large measurement errors are generated due to the inability of the conventional method to account for the convolution of the instrument dynamics with the viscoelastic response of the soft sample when the measurement frequency becomes large, and the random-like thermal drift and the distributive hydrodynamic force effects when measuring the indentation in liquid.
    Type: Grant
    Filed: June 24, 2013
    Date of Patent: March 3, 2015
    Assignee: Rutgers, The State University of New Jersey
    Inventors: Qingze Zou, Juan Ren
  • Publication number: 20130347147
    Abstract: A control-based approach is provided for achieving accurate indentation quantification in broadband and in-liquid nanomechanical property measurements using atomic force microscope (AFM). Accurate indentation measurement is desirable for probe-based material property characterization because the force applied and the indentation generated are the fundamental physical variables that are measured in the characterization process. Large measurement errors, however, occur when the measurement frequency range becomes large (i.e., broadband), or the indentation is measured in liquid on soft materials. Such large measurement errors are generated due to the inability of the conventional method to account for the convolution of the instrument dynamics with the viscoelastic response of the soft sample when the measurement frequency becomes large, and the random-like thermal drift and the distributive hydrodynamic force effects when measuring the indentation in liquid.
    Type: Application
    Filed: June 24, 2013
    Publication date: December 26, 2013
    Inventors: Qingze Zou, Juan Ren
  • Publication number: 20100051467
    Abstract: A process for surface treating aluminum and aluminum alloy articles is provided. The method includes the steps of providing a substrate of aluminum or aluminum alloy material, the substrate having an internal surface and an external surface; machining the external surface of substrate, thereby forming a first surface appearance on the external surface; forming a first oxide coating with a first color on the substrate surface by a first anodizing process; removing at least a portion of the first oxide coating on the internal surface of the substrate to make the substrate electricity conductive; machining the external surface of the substrate, thereby removing at least a portion of the first oxide coating on the external surface and forming a second surface appearance thereon; forming a second oxide coating with a second color on the area of the external surface excluding the first oxide coating by a second anodizing process.
    Type: Application
    Filed: August 3, 2009
    Publication date: March 4, 2010
    Applicants: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD., FIH (Hong Kong) Limited
    Inventors: MIN TIAN, NAI-JUAN REN
  • Publication number: 20060286392
    Abstract: A housing (100) includes a housing base (10), a chromium film (12), and a chromium carbide film (14). The housing base is made of a material of metal or metal alloys. The chromium film is formed on a surface of the housing base, and the chromium carbide film is formed on a surface of the chromium film. The present invention also provides a method for making the housing.
    Type: Application
    Filed: April 3, 2006
    Publication date: December 21, 2006
    Applicant: FIH Co., LTD
    Inventors: Chih-Pen Lin, Yong-Ming Li, Yi-Lin Zhang, Cheng-Guo Zhang, Nai-Juan Ren, Xian-Feng Luo