Abstract: The inputs to an embedded core, e.g., the core terminals, may not be directly connected to pins on the SoC. The lack of direct access to an embedded core's terminals may complicate testing of the embedded core. A test wrapper including boundary scan test (BST) cells may be used to test an embedded core. Dual function BST/ATPG (Automatic Test Pattern Generation) cells may be used to perform both BST and ATPG tests on embedded cores. A BIST (Built-In Self Test) controller supporting a “resume” mode in addition to a “pass/fail” mode may be used to compensate for timing latencies introduced by pipeline staging in an embedded memory array.

Abstract: In one embodiment, a digital signal processor includes look ahead logic to decrease the number of bubbles inserted in the processing pipeline. The processor receives data containing instructions in a plurality of buffers and decodes the size of a first instruction. The beginning of a second instruction is determined based on the size of the first instruction. The size of the second instruction is decoded and the processor determines whether loading the second instruction will deplete one of the plurality of buffers.

Abstract: A new branch notification processor instruction may be added to a pipelined processor with static branch prediction. The instruction may be used to instruct the processor to fetch the instruction at the branch's target.

Abstract: A programmable processor is adapted to detect exception conditions associated with one or more instructions before the instructions are executed. The detected exception conditions may be stored with the one or more instructions in a prefetch unit. Then, the exception conditions may be issued in parallel with the issuance of the instructions.