Abstract: A method of determining one or more shading conditions associated with a structure is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of a first image of a structure. The method may further include determining a relative azimuth of the reference roof edge from a lower hemisphere of a second, different image captured proximate the structure. In addition, the method may include determining one or more shading conditions associated with the structure based on the azimuth of the reference roof edge and the relative azimuth of the reference roof edge.

Abstract: A method of determining one or more shading conditions associated with a structure is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of a first image of a structure. The method may further include determining a relative azimuth of the reference roof edge from a lower hemisphere of a second, different image captured proximate the structure. In addition, the method may include determining one or more shading conditions associated with the structure based on the azimuth of the reference roof edge and the relative azimuth of the reference roof edge.

Abstract: A method of determining one or more shading conditions associated with a structure is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of an aerial image of a structure. The method may include capturing at least one spherical image at at least one measurement location proximate the structure. Further, the method may include determining a relative azimuth of the reference roof edge from a lower hemisphere of the at least one image. In addition, the method may include determining an orientation of an upper hemisphere of the at least one image based on the azimuth of the reference roof edge and the relative azimuth of the reference roof edge. Furthermore, the method may include calculating shading conditions based on the orientation of the upper hemisphere of the at least one spherical image.

Abstract: An electronic device such as a portable electronic device may have display with a capacitive touch sensor. A cover may have a front portion and a rear portion that bend along a bend axis. The front portion may overlap the display when the cover is closed. Conductive structures such as a patterned conductive layer having elongated strips of conductive material separated by gaps or another predetermined pattern may be formed in the front portion of a cover or other portion of a cover that overlaps the display and capacitive touch sensor when the cover is closed. Control circuitry in the device can gather capacitance images with the touch sensor and can detect when the cover has transitioned from open to closed or from closed to open from whether the predetermined pattern becomes present or becomes absent in the capacitance images.

Abstract: An electronic device such as a portable electronic device may have display with a capacitive touch sensor. A cover may have a front portion and a rear portion that bend along a bend axis. The front portion may overlap the display when the cover is closed. Conductive structures such as a patterned conductive layer having elongated strips of conductive material separated by gaps or another predetermined pattern may be formed in the front portion of a cover or other portion of a cover that overlaps the display and capacitive touch sensor when the cover is closed. Control circuitry in the device can gather capacitance images with the touch sensor and can detect when the cover has transitioned from open to closed or from closed to open from whether the predetermined pattern becomes present or becomes absent in the capacitance images.

Abstract: An electronic device such as a portable electronic device may have display with a capacitive touch sensor. A cover may have a front portion and a rear portion that bend along a bend axis. The front portion may overlap the display when the cover is closed. Conductive structures such as a patterned conductive layer having elongated strips of conductive material separated by gaps or another predetermined pattern may be formed in the front portion of a cover or other portion of a cover that overlaps the display and capacitive touch sensor when the cover is closed. Control circuitry in the device can gather capacitance images with the touch sensor and can detect when the cover has transitioned from open to closed or from closed to open from whether the predetermined pattern becomes present or becomes absent in the capacitance images.

Abstract: An electronic device such as a portable electronic device may have display with a capacitive touch sensor. A cover may have a front portion and a rear portion that bend along a bend axis. The front portion may overlap the display when the cover is closed. Conductive structures such as a patterned conductive layer having elongated strips of conductive material separated by gaps or another predetermined pattern may be formed in the front portion of a cover or other portion of a cover that overlaps the display and capacitive touch sensor when the cover is closed. Control circuitry in the device can gather capacitance images with the touch sensor and can detect when the cover has transitioned from open to closed or from closed to open from whether the predetermined pattern becomes present or becomes absent in the capacitance images.

Abstract: A method of determining one or more shading conditions associated with a structure is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of an aerial image of a structure. The method may include capturing at least one spherical image at at least one measurement location proximate the structure. Further, the method may include determining a relative azimuth of the reference roof edge from a lower hemisphere of the at least one image. In addition, the method may include determining an orientation of an upper hemisphere of the at least one image based on the azimuth of the reference roof edge and the relative azimuth of the reference roof edge. Furthermore, the method may include calculating shading conditions based on the orientation of the upper hemisphere of the at least one spherical image.

Abstract: A solar power measurement method is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of an aerial image of a structure. The method may include capturing at least one spherical image at at least one determined measurement location proximate the structure. Further, the method may include determining a relative azimuth of the reference roof edge from a downward view of a lower hemisphere of the at least one image. In addition, the method may include determining an orientation of an upper hemisphere of the at least one image based on the azimuth of the reference roof edge, the relative azimuth of the reference roof edge, and a known tilt of a roof edge of the structure. Furthermore, the method may include calculating shading conditions for a time period for known sun positions during the time period based on the orientation of the upper hemisphere of the at least one spherical image.

Abstract: A solar power measurement method is provided. A method may include determining an azimuth of a reference roof edge relative to an orientation of an aerial image of a structure. The method may include capturing at least one image at at least one determined measurement location proximate the structure. Further, the method may include determining a relative azimuth of the reference roof edge from a downward view of a lower hemisphere of the at least one image. In addition, the method may include determining an orientation of an upper hemisphere of the at least one image based on the azimuth of the reference roof edge, the relative azimuth of the reference roof edge, and a known tilt of a roof edge of the structure. Furthermore, the method may include calculating shading conditions for a time period for known sun positions during the time period based on the orientation of the upper hemisphere of the at least one spherical image.

Abstract: The present disclosure is directed to determining at least one attribute of a roof of a structure. A system may include at least one image capture device configured to capture two or more images of a photovoltaic installation site. The system may also include an image processing engine communicatively coupled to the at least one image capture device and configured to receive at least two images from the at least one image capture device and determine at least one attribute of the roof at the installation site based on the at least two received images.