Patents by Inventor Judocus Stoeldraijer

Judocus Stoeldraijer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070099100
    Abstract: A method for improving the uniformity of a lithographic process. In one aspect, the probability density function of a first and second lithographic apparatus are matched by providing a continuous z-motion to a stage in the first lithographic apparatus during substrate exposure. Preferably, the z-motion is characterized by a normally distributed function, wherein the effective probability density function of the first apparatus is substantially similar to the probability density function of the second apparatus.
    Type: Application
    Filed: October 18, 2006
    Publication date: May 3, 2007
    Applicant: ASML Netherlands B.V.
    Inventors: Jozef Finders, Johannes Quaedackers, Judocus Stoeldraijer, Johannes De Klerk, Alexander Serebryakov
  • Publication number: 20050146702
    Abstract: The present invention provides a lithographic apparatus comprising an illumination system for providing a projection beam of radiation. The illumination system comprises at least one movable optical element (7), such that a projection beam of radiation (4) can be shifted around a central position. This ensures that inhomogeneities in the intensity distribution in the projection beam (4) will be smeared out, which in turn provides an improved homogeneity of the exposure of a surface to be illuminated by the system, such as a wafer or other substrate. The optical element (7) may comprise a motor movable mirror, prism, filter, lens, axicon, diffuser, diffractive optical array, optical integrator, etc. The invention further provides a device manufacturing method, using a lithographic apparatus according to the invention, wherein the optical element is moved, in order to provide an optimum homogeneity for the projection beam of radiation.
    Type: Application
    Filed: October 29, 2004
    Publication date: July 7, 2005
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Markus Eurlings, Johannes Baselmans, Hako Botma, Jan Bruining, Marcel Mathijs Dierichs, Antonius Johannes Dijsseldonk, Judocus Stoeldraijer
  • Publication number: 20050100831
    Abstract: A method for exposing a resist layer on a substrate to an image of a pattern on a mask is disclosed whereby, after starting exposure and before completing exposure, a controlled amount of contrast loss is introduced by a controller in the image at the resist layer by changing during exposure the position of the substrate holder. The contrast loss affects the pitch dependency of the resolution of a lithographic projection apparatus, and its control is used to match pitch dependency of resolution between different lithographic projection apparatus.
    Type: Application
    Filed: September 9, 2004
    Publication date: May 12, 2005
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Jozef Finders, Judocus Stoeldraijer, Johannes Klerk