Patents by Inventor Judy Wan

Judy Wan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Enabling test modes of individual integrated circuit devices out of a plurality of integrated circuit devices
    Patent number: 7900099
    Abstract: Methods and apparatus are provided. A common test-mode enable signal is received at two or more integrated circuit devices of an electronic system. A test mode of only an integrated circuit device of the two or more integrated circuit devices that was last to receive a valid command is enabled in response to the common test-mode enable signal.
    Type: Grant
    Filed: January 25, 2005
    Date of Patent: March 1, 2011
    Assignee: Micron Technology, Inc.
    Inventors: Judy Wan, Benjamin Louie
  • Accessing test modes using command sequences
    Patent number: 7213188
    Abstract: An integrated circuit device receives a sequence of commands and enables a test mode of the integrated circuit device in response to the command sequence when all of the commands of the sequence are correct. The integrated circuit device disables the test mode upon receiving an incorrect command of the sequence.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: May 1, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Benjamin Louie, Judy Wan
  • Enabling test modes of individual integrated circuit devices out of a plurality of integrated circuit devices
    Publication number: 20060164894
    Abstract: Methods and apparatus are provided. A common test-mode enable signal is received at two or more integrated circuit devices of an electronic system. A test mode of only an integrated circuit device of the two or more integrated circuit devices that was last to receive a valid command is enabled in response to the common test-mode enable signal.
    Type: Application
    Filed: January 25, 2005
    Publication date: July 27, 2006
    Inventors: Judy Wan, Benjamin Louie
  • Accessing test modes using command sequences
    Publication number: 20060048033
    Abstract: Apparatus and methods are provided. An integrated circuit device receives a sequence of commands and enables a test mode of the integrated circuit device in response to the command sequence when all of the commands of the sequence are correct. The integrated circuit device disables the test mode upon receiving an incorrect command of the sequence.
    Type: Application
    Filed: August 31, 2004
    Publication date: March 2, 2006
    Inventors: Benjamin Louie, Judy Wan