Patents by Inventor Jue Wu

Jue Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7296104
    Abstract: A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: November 13, 2007
    Assignee: Sun Microsystems, Inc.
    Inventors: Brian L. Smith, Jue Wu, Jyh-Ming Jong, Wai Fong, Leo Yuan, Prabhansu Chakrabarti
  • Publication number: 20060009931
    Abstract: A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
    Type: Application
    Filed: September 12, 2005
    Publication date: January 12, 2006
    Inventors: Brian Smith, Jue Wu, Jyh-Ming Jong, Wai Fong, Leo Yuan, Prabhansu Chakrabarti
  • Patent number: 6944692
    Abstract: A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
    Type: Grant
    Filed: September 13, 2001
    Date of Patent: September 13, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Brian L. Smith, Jue Wu, Jyh-Ming Jong, Wai Fong, Leo Yuan, Prabhansu Chakrabarti
  • Publication number: 20030051086
    Abstract: A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
    Type: Application
    Filed: September 13, 2001
    Publication date: March 13, 2003
    Inventors: Brian L. Smith, Jue Wu, Jyh-Ming Jong, Wai Fong, Leo Yuan, Prabhansu Chakrabarti