Abstract: A system for thermal analysis, including a sample crucible on a sample side and a reference crucible on a reference side in a measurement chamber, where the sample cup and the reference cup are each provided with a Peltier system for adjusting the temperature and/or for detecting the temperature.

Abstract: A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.

Abstract: The present invention relates to a device for detecting the thermal conductivity by application of optical pulse techniques. A sample preheated in a furnace is exposed to energy by means of an optical pulse. The temperature profile in the sample is recorded by means of an infrared sensor. The thermal conductivity of the sample can then be detected by mathematical derivation. To reduce tho influence of the time history of the optical pulse on measurement, a measuring means is provided for determining this history, An analyzer unit then derives therefrom the corrected temperature profile.

Abstract: The present invention relates to a device for detecting the thermal conductivity by application of optical pulse techniques. A sample preheated in a furnace is exposed to energy by means of an optical pulse. The temperature profile in the sample is recorded by means of an infrared sensor. The thermal conductivity of the sample can then be detected by mathematical derivation. To reduce the influence of the time history of the optical pulse on measurement a measuring means is provided for determining this history. An analyzer unit then derives therefrom the corrected temperature profile. In order to reduce the influence of the time history of the optical pulse on measurement a measuring means is provided for determining this history. An analyzer unit then derives therefrom the corrected temperature profile.