Abstract: A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Abstract: A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Abstract: A method for the characterization of a silicon layer on a translucent substrate, in particular, for the characterization of a solar cell blank, includes detecting by at least one optical detector, the light transmitted through the silicon layer and/or reflected on the silicon layer. The method also includes determining a degree of absorption of the silicon layer for at least one wavelength by means of the detected light. The method further includes determining a quantity ratio between an amorphous fraction and a crystalline fraction of the silicon layer or between one of these fractions and the total of these fractions by means of the degree of absorption.

Abstract: The target apparatus for positioning a drilling tool with respect to a drilling channel to be created in a bone consists of a target hook and a guide arm which is releasably connected to this and on which there is arranged a receiver for the drilling tool, and a guide path in the form of a laterally through-going open groove for the guide arm. The guide arm may be displaced and fixed in the guide path. A simple assembly and disassembly of the apparatus is achieved in that the guide arm on the side of the apparatus is applied into the guide path through the groove opening and reversely, by lifting away out of the groove, may be separated from the target hook.

Abstract: The device for conditioning an organic ligament to be implanted, in particular a ligament as a cruciate ligament replacement, is equipped with first and second receiving elements for receiving and tensioning the ligament at two spaced locations. The first receiving elements is connected to means for the periodic translatory adjustment of the first receiving element with respect to the ligament.

Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.

Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.