Abstract: A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Abstract: An apparatus for setting a divergence and/or convergence of a light beam includes at least one optical component for influencing the divergence and/or convergence of the light beam. A positioning device is provided for positioning the optical component. The positioning device includes at least one piezoelectric element.

Abstract: An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.

Abstract: A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens includes varying an intensity distribution of excitation light by varying an excitation/illumination volume over a plurality of mutually independent measurements. A determination is made as to whether observed time constants change between the measurements. The existence of a dark state is inferred where the observed time constants are unchanged between the measurements.

Abstract: An optical arrangement for a microscope, in particular for a scanning microscope, with a beam splitter 1 arranged in a divergent and/or convergent beam path for separating an illumination light 2 that is produced by an illumination source from a detection light 3 that is emitted by a sample being tested, which with regard to reliable correction of imaging errors can be implemented and developed even when using thick beam splitters 1 such that the beam splitter 1 is wedge-shaped and implemented as a beam splitter plate for reflection primarily at a glass-air interface 4. Furthermore, a microscope with such an optical arrangement is disclosed.

Abstract: A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens (1), in particular using fluorescent proteins, the excitation/illumination volume, thus the intensity distribution of the excitation light, being varied over the course of at least two mutually independent measurements, a determination being made as to whether the observed time constants change and, in the case of unchanged time constants, the existence of a dark state being inferred.

Abstract: An apparatus for setting a divergence and/or convergence of a light beam includes at least one optical component for influencing the divergence and/or convergence of the light beam. A positioning device is provided for positioning the optical component. The positioning device includes at least one piezoelectric element.

Abstract: An optical arrangement for a microscope, in particular for a scanning microscope, with a beam splitter 1 arranged in a divergent and/or convergent beam path for separating an illumination light 2 that is produced by an illumination source from a detection light 3 that is emitted by a sample being tested, which with regard to reliable correction of imaging errors can be implemented and developed even when using thick beam splitters 1 such that the beam splitter 1 is wedge-shaped and implemented as a beam splitter plate for reflection primarily at a glass-air interface 4. Furthermore, a microscope with such an optical arrangement is disclosed.

Abstract: The invention relates to a device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Abstract: An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.

Abstract: A confocal scanning microscope for scanning a sample has an illumination beam path that encompasses at least one point light source and a beam deflection device, and has further a detection beam path that encompasses at least one detection pinhole and the beam deflection device. The routing of the illumination beam path and/or of the detection beam path is adaptable to the scanning speed.