Abstract: An optical probing system transmits high-fidelity analog signals from a device under test (DUT) to a measurement instrument. The system receives a differential input signal and separates it into a high-frequency (HF) component and a low-frequency (LF) component. Each component is independently modulated using distinct analog modulation techniques and transmitted over separate optical fibers. The architecture maintains galvanic isolation between the input and output devices and enables independent transmission of signal portions optimized for bandwidth and accuracy. The signals are demodulated, delay-aligned, and recombined in the analog domain to produce a reconstructed full-bandwidth output.

Abstract: An adjustable probe tip for testing and measuring differential signals on a DUT, the probe tip features an electrically conductive support layer and an electrically conductive double-barrel housing. The double barrel housing has a test barrel and an reference barrel. The test barrel is mountable to a recessed portion of the support layer in an axially secured and rotatable fashion.

Abstract: A probe head with a cylindrical portion and an oblique truncated portion angled downward toward a high-powered electronic device under testing. The probe head has a proximal end comprising an oblique truncated cone portion angled relative to the longitudinal axis at an input angle and has an analog signal input. The probe head has a digital signal output provided on the distal end of the housing.