Patents by Inventor Juha Heikkinen

Juha Heikkinen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11914184
    Abstract: An integrated optically functional multilayer structure includes a flexible, substrate film arranged with a circuit design including at least a number of electrical conductors on the substrate film; and a plurality of top-emitting, bottom-installed light sources provided upon a first side of the substrate film to internally illuminate at least portion of the structure for external perception via associated outcoupling areas, wherein for each light source of the plurality of light sources there is optically transmissive plastic layer, produced upon the first side of the substrate film, said plastic layer at least laterally surrounding the light source, the substrate film at least having a similar or lower refractive index therewith; and reflector design including at least one material layer, provided at least upon the light source and configured to reflect the light emitted by the light source and incident upon the reflective layer towards the plastic layer.
    Type: Grant
    Filed: June 22, 2023
    Date of Patent: February 27, 2024
    Assignee: TACTOTEK OY
    Inventors: Antti Keränen, Tero Heikkinen, Pasi Korhonen, Pälvi Apilo, Mikko Heikkinen, Jarmo Sääski, Paavo Niskala, Ville Wallenius, Heikki Tuovinen, Janne Asikkala, Taneli Salmi, Suvi Kela, Outi Rusanen, Johanna Juvani, Mikko Sippari, Tomi Simula, Tapio Rautio, Samuli Yrjänä, Tero Rajaniemi, Simo Koivikko, Juha-Matti Hintikka, Hasse Sinivaara, Vinski Bräysy, Olimpia Migliore, Juha Sepponen
  • Publication number: 20210262792
    Abstract: An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwave range of electromagnetic signals, and the first sensors receive at least two of the microwave signals of the interaction with information relating to distances between the sensors and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the first sensors. A data processing unit receives said information on the distances, and determines at least one geometrical parameter of the surface on the basis of the information.
    Type: Application
    Filed: February 23, 2021
    Publication date: August 26, 2021
    Inventors: Pekka JAKKULA, Juha HEIKKINEN, Matti LIMINGOJA, Mikko VUOLTEENAHO
  • Patent number: 7616009
    Abstract: An object to be measured is measured using microwave radiation. Oscillation energy is generated by means of a feedback coupled active unit. The solution involves generating resonance into at least one oscillator, each oscillator comprising at least one open resonator, each resonator being coupled to at least one active unit, by using the object to be measured as a functional part of the resonator, the object to be measured causing a resonance frequency dependent on the location of a surface of the object to be measured to be generated in each oscillator. A measurement part determines at least one characteristic of the object to be measured on the basis of the resonance frequency of each oscillator.
    Type: Grant
    Filed: September 19, 2005
    Date of Patent: November 10, 2009
    Assignee: Senfit Oy
    Inventors: Pekka Jakkula, Taavi Hirvonen, Juha Heikkinen, Taisto Soikkeli, Olavi Hyry, Jarmo Karhu
  • Publication number: 20070268024
    Abstract: An object to be measured is measured using microwave radiation. Oscillation energy is generated by means of a feedback coupled active unit. The solution involves generating resonance into at least one oscillator, each oscillator comprising at least one open resonator, each resonator being coupled to at least one active unit, by using the object to be measured as a functional part of the resonator, the object to be measured causing a resonance frequency dependent on the location of a surface of the object to be measured to be generated in each oscillator. A measurement part determines at least one characteristic of the object to be measured on the basis of the resonance frequency of each oscillator.
    Type: Application
    Filed: September 19, 2005
    Publication date: November 22, 2007
    Inventors: Pekka Jakkula, Taavi Hirvonen, Juha Heikkinen, Taisto Soikkeli, Olavi Hyry, Jarmo Karhu