Abstract: A testing apparatus for testing a device. In accordance with an embodiment the testing apparatus includes a base part; a testing head; first movement rails attached with the base part; a first movement platform positioned on top of the first movement rails adapted to enable movement of the first movement platform in a first direction; a second movement platform attached with the first movement platform so that the second movement platform is adapted to be movable in a second direction transverse to the first direction; a first support adapted to be movable in a third direction transverse to the first direction and the second direction; a movement mechanism for moving the testing head; and a second support attached with the vertical support for supporting the movement mechanism and the testing head. The movement mechanism comprises a first axis for pivoting the testing head; a second axis for tilting the testing head; and a third axes for rotating the testing head.

Abstract: A method is provided for dividing a pattern into a plurality of sub-patterns, each sub-pattern being adapted for use with an image search method that can provide a plurality of sub-pattern search results. The method represents the pattern as a plurality of feature points, generates candidate partitions of the plurality of feature points, and then scores the candidate partitions by examining characteristics of each potential sub-pattern of each candidate partition. The highest-scoring partition is selected, and then it is applied to the plurality of feature points, creating one or more sub-pluralities of features. The invention advantageously provides a plurality of sub-patterns where each sub-pattern contains enough information to be located with a feature-based search method, where that information has been pre-evaluated as being useful and particularly adapted for running feature-based searches.

Abstract: A method is provided for dividing a pattern into a plurality of sub-patterns, each sub-pattern being adapted for use with an image search method that can provide a plurality of sub-pattern search results. The method represents the pattern as a plurality of feature points, generates candidate partitions of the plurality of feature points, and then scores the candidate partitions by examining characteristics of each potential sub-pattern of each candidate partition. The highest-scoring partition is selected, and then it is applied to the plurality of feature points, creating one or more sub-pluralities of features. The invention advantageously provides a plurality of sub-patterns where each sub-pattern contains enough information to be located with a feature-based search method, where that information has been pre-evaluated as being useful and particularly adapted for running feature-based searches.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: A method is provided for dividing a pattern into a plurality of sub-patterns, each sub-pattern being adapted for use with an image search method that can provide a plurality of sub-pattern search results. The method represents the pattern as a plurality of feature points, generates candidate partitions of the plurality of feature points, and then scores the candidate partitions by examining characteristics of each potential sub-pattern of each candidate partition. The highest-scoring partition is selected, and then it is applied to the plurality of feature points, creating one or more sub-pluralities of features. The invention advantageously provides a plurality of sub-patterns where each sub-pattern contains enough information to be located with a feature-based search method, where that information has been pre-evaluated as being useful and particularly adapted for running feature-based searches.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.

Abstract: A method of analyzing machine vision images to identify low contrast features such as scratches or cracks on the polished ends of optical fibers. A bank of oriented filters having incremental angles of orientation are tuned to respond to the frequency characteristics of oriented scratches or cracks having an approximate width. The filters are applied to an image to generate a filter response image for each filter orientation. The set of filter response images are combined to form a single data set indicating a magnitude and angle for each pixel in the original image. Elements of the combined data set having corresponding angles and magnitudes are grouped to form contour components that can be optionally input to higher order processes.

Abstract: A method is provided for dividing a pattern into a plurality of sub-patterns, each sub-pattern being adapted for use with an image search method that can provide a plurality of sub-pattern search results. The method represents the pattern as a plurality of feature points, generates candidate partitions of the plurality of feature points, and then scores the candidate partitions by examining characteristics of each potential sub-pattern of each candidate partition. The highest-scoring partition is selected, and then it is applied to the plurality of feature points, creating one or more sub-pluralities of features. The invention advantageously provides a plurality of sub-patterns where each sub-pattern contains enough information to be located with a feature-based search method, where that information has been pre-evaluated as being useful and particularly adapted for running feature-based searches.

Abstract: An efficient and reliable method and apparatus is disclosed that finds a reference point of an object profile within an image when the object is of an unknown size. The object profile is modeled using a synthetic labeled-projection model, which in conjunction with the image, is projected over a portion of the image of the object profile to derive a histogram. The histogram is normalized and a maximum of a first derivative of the histogram is defined for that position. The position of the labeled-projection model is moved relative to the image, and the process is repeated until a selected portion of the image has been examined. The first derivative of the normalized labeled projection is greatest when a feature of the image and the feature denoted by a specific synthetic label of the labeled-projection model are aligned. The method and apparatus can locate the center of the object with reliability, because use of the labeled-projection model and the histogram minimizes the * effects of image artifacts.

Abstract: A method is provided for locating features of an object using varied lighting. An object is illuminated and a first digital image of the object is acquired. An illumination of the object is varied and a second digital image of the object is acquired while a camera and the object are in a same position as the camera and the object were during the acquiring of the first digital image. One of the first and the second digital image is subtracted from another of the first and the second digital image to produce a difference image. At least one feature of the object is located based on the difference image.

Abstract: An apparatus is provided for locating features of an object using varied lighting. The apparatus includes an image processor which is configured to send a plurality of commands to a digital camera which is used to obtain a plurality of digital images of an object without moving a location of the digital camera and the object. The image processor is arranged to receive the digital images of the object from the digital camera and the image processor is configured to control a level of illumination from at least one light source for illuminating the object. The image processor includes an illumination changer, a subtracter, an analyzer, and a controller to control and coordinate the illumination changer, the subtracter, and the analyzer. The illumination changer changes a level of illumination of any of the at least one lighting source before the image processor sends a command to the digital camera to obtain a next digital image.

Abstract: A method is provided for obtaining a focused image of an object in an application of machine vision in an optical inspection system. A coarse focus setting is first obtained by maximizing a coarse feature sharpness measurement performed on an image of the object of inspection. Then, a fine focus setting is obtained by maximizing a fine feature sharpness measurement performed on a portion of an image of the object of inspection. Finally, the fine focused image can be further analyzed, inspected, or otherwise processed.

Abstract: A method of training a system to identify inspection sites on a circuit board is described. The method uses a priori information, which includes a region of interest, approximate sizes and approximate spacings of a plurality of nominal pad locations, and a pad count or an aperture count. A region is created which is associated with each one of the nominal pad locations within an image of a printed circuit board. A search tool is run to find pad candidates within each one of the regions. The pad candidates are filtered. The best pad candidates are selected from among each of the found pad candidates. The best pad candidates are averaged to provide an average, and are modified based on the average.

Abstract: A method involves training a system to identify inspection sites on a printed circuit board. The method uses a priori information, which includes a sample pad description. A training region of interest is created within an image of the printed circuit board. A search tool is run to find pad candidates within the training region. The pad candidates are filtered and false pad candidates are eliminated. The filtered pad candidates are averaged to provide an average, and are modified based on the average.

Abstract: Inspection of solder paste on a printed circuit board using a before printing image (pre-application image) to normalize an after printing image (post-application image) of the printed circuit board. Existing lighting and optics used for alignment of the screen-printing stencil to the printed circuit board are used for the solder paste inspection. An embodiment is described wherein pad regions of the printed circuit board are inspected for information about the solder paste applied on the pad regions of the printed circuit board. A stencil in the screen printing process is also inspected using a before printing image (pre-application) to normalize an after printing image (post-application) of the stencil.

Abstract: Inspection of solder paste on a printed circuit board using a before printing image (pre-application image) to normalize an after printing image (post-application image) of the printed circuit board. Existing lighting and optics used for alignment of the screen-printing stencil to the printed circuit board are used for the solder paste inspection. An embodiment is described wherein pad regions of the printed circuit board are inspected for information about the solder paste applied on the pad regions of the printed circuit board. A stencil in the screen printing process is also inspected using a before printing image (pre-application) to normalize an after printing image (post-application) of the stencil.

Abstract: An efficient and reliable method and apparatus is disclosed that finds a reference point of an object profile within an image when the object is of an unknown size. The object profile is modeled using a synthetic labeled-projection model, which in conjunction with the image, is projected over a portion of the image of the object profile to derive a histogram. The histogram is normalized and a maximum of a first derivative of the histogram is defined for that position. The position of the labeled-projection model is moved relative to the image, and the process is repeated until a selected portion of the image has been examined. The first derivative of the normalized labeled projection is greatest when a feature of the image and the feature denoted by a specific synthetic label of the labeled-projection model are aligned. The method and apparatus can locate the center of the object with reliability, because use of the labeled-projection model and the histogram minimizes the * effects of image artifacts.