Abstract: A method for forming a semiconductor structure comprising a silicon-on-insulator layer structure with crystalline silicon oxide SiOx as the insulator material comprises: providing a crystalline silicon substrate having a substantially clean deposition surface in a vacuum chamber; heating the silicon substrate to an oxidation temperature To in the range of 550 to 1200 ° C.; supplying, while keeping the silicon substrate in the oxidation temperature, with an oxidation pressure Po in the range of 1·10?8 to 1·10?4 mbar in the vacuum chamber, molecular oxygen O2 into the vacuum chamber with an oxygen dose Do in the range of 0.1 to 1000 Langmuir; whereby a crystalline silicon oxide layer with a thickness of at least two molecular layers is formed within the silicon substrate, between a crystalline silicon base layer and a crystalline silicon top layer. Related semiconductor structures are described.

Abstract: Solutions for interference detection are provided. A frequency band is scanned (200) for transmissions of a transmission system. One or more parameters are determined (202) from the obtained scanning results. At least one determined parameter is compared (204) to a threshold value. On the basis of the comparison it is determined (206) that an unknown transmission exists on a given frequency band. One or more transmission systems are determined (208) which may be the cause of the unknown transmission. At least part of the given frequency band is scanned (210) for transmissions of the determined one or more transmission system; and on the basis of the scanning the system causing the unknown transmission is determined. Information related to the system and transmission parameters of the unknown transmission are decoded (212).

Abstract: Solutions for interference detection are provided. A frequency band is scanned (200) for transmissions of a transmission system. One or more parameters are determined (202) from the obtained scanning results. At least one determined parameter is compared (204) to a threshold value. On the basis of the comparison it is determined (206) that an unknown transmission exists on a given frequency band. One or more transmission systems are determined (208) which may be the cause of the unknown transmission. At least part of the given frequency band is scanned (210) for transmissions of the determined one or more transmission system; and on the basis of the scanning the system causing the unknown transmission is determined. Information related to the system and transmission parameters of the unknown transmission are decoded (212).

Abstract: Testing apparatuses and methods are provided. The solution comprises establishing a digital connection with an external controller, receiving from the external controller on the digital connection test parameters and a command to establish a wireless connection to a given subscriber address, establishing a wireless phone call connection to the given subscriber address, receiving sample audio data on the connection, and transmitting information related to the received sample audio data to the external controller using the digital connection.