Patents by Inventor Jui Hua Liu

Jui Hua Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10612910
    Abstract: Systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: April 7, 2020
    Assignee: Apple Inc.
    Inventors: Denis G. Chen, Jui Hua Liu, Xingxing Cai
  • Publication number: 20190195620
    Abstract: Systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass.
    Type: Application
    Filed: February 22, 2019
    Publication date: June 27, 2019
    Inventors: Denis G. Chen, Jui Hua Liu, Xingxing Cai
  • Patent number: 10215555
    Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.
    Type: Grant
    Filed: August 10, 2017
    Date of Patent: February 26, 2019
    Assignee: Apple Inc.
    Inventors: Denis G. Chen, Jui Hua Liu, Xingxing Cai
  • Publication number: 20180080758
    Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.
    Type: Application
    Filed: August 10, 2017
    Publication date: March 22, 2018
    Inventors: Denis G. Chen, Jui Hua Liu, Xingxing Cai