Abstract: A semiconductor device includes a circuit layer and a nanopore layer. The nanopore layer is formed on the circuit layer and is formed with a pore therethrough. The circuit layer includes a circuit unit configured to drive a biomolecule through the pore and to detect a current associated with a resistance of the nanopore layer, whereby a characteristic of the biomolecule can be determined using the currents detected by the circuit unit.

Abstract: A charging plug for high-current charging equipment, the upper end face of main body is provided with an abutting hole corresponding to the socket, and the conducting strips are partially exposed in the abutting hole. A boss extends transversely along the edge of abutting hole in the main body. The charging plug is provided with a protective cover. The protective cover comprises a cover body matching the abutting hole, a collar part fitted over main body and an interconnecting piece connecting the cover body with collar part.

Abstract: A charging plug for high-current charging equipment, the upper end face of main body is provided with an abutting hole corresponding to the socket, and the conducting strips are partially exposed in the abutting hole. A boss extends transversely along the edge of abutting hole in the main body. The charging plug is provided with a protective cover. The protective cover comprises a cover body matching the abutting hole, a collar part fitted over main body and an interconnecting piece connecting the cover body with collar part.

Abstract: A high-power charging plug is disclosed. The charging plug comprises a case body having an installation cavity disposed therein, installation holes disposed at both sides thereof, front terminal holes disposed on a front side thereof, and back terminal holes disposed on a back side thereof; a terminal set including a plurality of independent terminals having one-piece front terminals and back terminals, a pull ring component including a pull ring, rivets, and rivet sleeves. The charging plug is not only a plug but also a socket. Another charging plug can be plugged into the socket on the charging plug in use to charge multiple products at the same time. It is convenient and practical.

Abstract: A low dropout regulator is provided. The low dropout regulator includes an output-stage circuit, a reference-voltage generation circuit, a timing controller, and an active low dropout circuit. When the low dropout regulator is at an operation mode, the output-stage circuit is controlled by a first enable signal to generate first output voltage to an output node of the low dropout regulator. The reference-voltage generation circuit is controlled by a bias voltage to generate a first reference voltage. The timing controller is coupled to the output node and receives the first reference voltage. When the low dropout regulator is in the operation mode, the timing controller programs the first enable signal according to the reference voltage and the voltage at the output node. When the low dropout regulator is in a standby mode, the active low dropout circuit generates a second output voltage to the output node.

Abstract: A low dropout regulator is provided. The low dropout regulator includes an output-stage circuit, a reference-voltage generation circuit, a timing controller, and an active low dropout circuit. When the low dropout regulator is at an operation mode, the output-stage circuit is controlled by a first enable signal to generate first output voltage to an output node of the low dropout regulator. The reference-voltage generation circuit is controlled by a bias voltage to generate a first reference voltage. The timing controller is coupled to the output node and receives the first reference voltage. When the low dropout regulator is in the operation mode, the timing controller programs the first enable signal according to the reference voltage and the voltage at the output node. When the low dropout regulator is in a standby mode, the active low dropout circuit generates a second output voltage to the output node.

Abstract: An anti-fuse memory cell is provided. The anti-fuse memory cell includes a programmable transistor and a selection transistor. The programmable transistor includes a gate structure, a first doped region and a lightly doped region. The first doped region is divided into a first portion doped region, a second portion doped region and a third portion doped region. The first and second portion doped regions are respectively a source and a drain of the programmable transistor, and the third portion doped region is disposed between the first and second portion doped regions. The lightly doped region is distributed around a channel region of the programmable transistor, and adjacent to the first, second and third portion doped regions. The selection transistor includes a gate structure and a second doped region, and connected in series to the programmable transistor through the first portion doped region.

Abstract: A memory device is provided. The memory device includes a memory device, a plurality of word lines and bit lines, first and second decoders, and a control circuit. The memory array includes memory cells on rows and columns. Each word line is coupled to the memory cells in one row. Each bit line is coupled to the memory cells in one column. The first decoder selects one word line according to an address signal and a first control signal. The control circuit respectively generates the first control signal and the second control signal according to a first clock signal and a second clock signal. In the period during which the first decoder selects the one word line, the second decoder selects at least two bit lines according to the address signal and a second control signal. The memory device performs a read/write operation on the selected bit lines.

Abstract: This invention provides a poly fuse burning system comprising a poly fuse, a controllable power source supplying power for burning the poly fuse, and a monitor circuit monitoring the burning state of the poly fuse, wherein when a targeted burning state is reached, a control signal is output to shut down the controllable power source to stop the burning.

Abstract: This invention provides a poly fuse burning system comprising a poly fuse, a controllable power source supplying power for burning the poly fuse, and a monitor circuit monitoring the burning state of the poly fuse, wherein when a targeted burning state is reached, a control signal is output to shut down the controllable power source to stop the burning.

Abstract: A storage device including a memory and a reading circuit is disclosed. The memory includes a plurality of word lines, a first bit line, a second bit line, a third bit line, and a plurality of cells. The word lines are sequentially disposed in parallel. The first, the second, and the third bit lines are sequentially disposed in parallel and vertical with the word lines. Each cell corresponds to one word line and one bit line. The word line, which corresponds to the cell corresponding to the first bit line, differs from the word line, which corresponds to the cell corresponding to the second bit line. The read circuit is coupled to the memory for reading the data stored in the memory.

Abstract: A burn-in method for SRAMs and chips. For a memory cell of the SRAM, the SRAM burn-in method controls the control signals of the memory cell to generate current paths to pass through the memory cell, the corresponding bit-line and the corresponding bit-line-bar. The contacts/vias in the current paths are tested by providing burn-in currents to flow through the current paths, so that mismatched contacts/vias are burned by the burn-in currents. SRAMs that fail the burn-in test are abandoned after the burn-in procedure.

Abstract: A storage device including a memory and a reading circuit is disclosed. The memory includes a plurality of word lines, a first bit line, a second bit line, a third bit line, and a plurality of cells. The word lines are sequentially disposed in parallel. The first, the second, and the third bit lines are sequentially disposed in parallel and vertical with the word lines. Each cell corresponds to one word line and one bit line. The word line, which corresponds to the cell corresponding to the first bit line, differs from the word line, which corresponds to the cell corresponding to the second bit line. The read circuit is coupled to the memory for reading the data stored in the memory.

Abstract: A burn-in method for SRAMs and chips. For a memory cell of the SRAM, the SRAM burn-in method controls the control signals of the memory cell to generate current paths to pass through the memory cell, the corresponding bit-line and the corresponding bit-line-bar. The contacts/vias in the current paths are tested by providing burn-in currents to flow through the current paths, so that mismatched contacts/vias are burned by the burn-in currents. SRAMs that fail the burn-in test are abandoned after the burn-in procedure.

Abstract: An asymmetric static random access memory (SRAM) device that includes at least one SRAM cell is provided. The SRAM cell includes the first inverter and the second inverter. The first inverter is coupled between a first power and a ground power, and includes a first output terminal coupled to a first node and a first input terminal coupled to a second node. The second inverter is coupled between the first power and the ground power, and includes a second input terminal coupled to the first node and a second output terminal coupled to the second node. When the first inverter and the second inverter receive current from the first power, the SRAM cell is programmed to a predetermined value in advance according to different conductance levels of the first inverter and the second inverter.

Abstract: A static random access memory comprising a column driver, a row driver, a cell, and a control unit is disclosed. The column driver selects a first word line or a second word line. The row provides data to a first bit line and a second bit line. The data of the first bit line is opposite to that of the second bit line. The control unit controls the voltage of the cell. In normal mode, the voltage of the cell is equal to a second voltage. In stand-by mode, the voltage of the cell exceeds the second voltage.

Abstract: A memory system is provided, comprising at least one memory unit and a source power supply circuit. Each memory unit is coupled between a source voltage and a ground voltage and accesses digital data according to a word line signal and a bit line signal. The source power supply circuit provides the source voltage to the memory units. When the memory unit is in a writing status, the source voltage is the first power voltage. When the memory unit is in a reading status, the source voltage is the second power voltage. The second power voltage equals to the first power voltage subtracted by a specific voltage for avoiding rewriting error.

Abstract: A memory system is provided, comprising at least one memory unit and a source power supply circuit. Each memory unit is coupled between a source voltage and a ground voltage and accesses digital data according to a word line signal and a bit line signal. The source power supply circuit provides the source voltage to the memory units. When the memory unit is in a writing status, the source voltage is the first power voltage. When the memory unit is in a reading status, the source voltage is the second power voltage. The second power voltage equals to the first power voltage subtracted by a specific voltage for avoiding rewriting error.

Abstract: A detection apparatus for sequentially programming a memory is provided. The detection apparatus comprises a current sensor and a programming controller. The current sensor is coupled to a programming source and a memory cell. The current sensor detects change of a programming current between the programming source and the memory cell and generates a control signal according to the detection result. The programming controller is coupled to the current sensor. The programming controller receives the control signal and generates a programming state signal.