Abstract: A touch screen structure for receiving and processing touch signal is disclosed, in which the touch screen structure includes a substrate, a plurality of conductive patterns, a plurality of first routing traces, and a plurality of second routing traces. The conductive patterns are disposed on the substrate, in which each of the conductive patterns has a first side and a second side disposed opposite to the first side. The first routing traces are disposed on the substrate, in which the first routing traces are electrically connected to the first sides of the conductive patterns. The second routing traces are disposed on the substrate, in which the second routing traces are electrically connected to the second sides of the conductive patterns.

Abstract: A touch panel including a substrate and a sensing array is provided. The sensing array is disposed on the substrate and includes a plurality of sensing units. Each sensing unit has a first sensing electrode and a second sensing electrode which are arranged in a staggered manner and are electrically insulated from each other. The first sensing electrode includes two parallel first sensing pads and a first connection portion. The second sensing electrode includes two parallel second sensing pads and a second connection portion. The first sensing pads, the first connection portion, the second sensing pads, and the second connection portion are in rectangular shapes, and short sides of the first connection portion and the second connection portion are electrically connected to middle portions of long sides of the first sensing pads and the second sensing pads respectively. The second connection portion and the first connection portion intersect each other.

Abstract: A touch cell applied to a capacitive touch panel includes a first electrode and a second electrode, where the first electrode is connected to a scan signal transmitting circuit of the capacitive touch panel, and is utilized for receiving a scan signal, and the second electrode is connected to a detecting circuit of the capacitive touch panel. In addition, the second electrode is not connected to the first electrode, the second electrode has a fish-bone pattern, and a width of a tail of branches of the fish-bone pattern is greater than a width of a head of the branches of the fish-bone pattern.

Abstract: A measuring equipment, such as a vector network analyzer, is provided. The measuring equipment includes a first port and a second port, a probe connected to the first port, an antenna connected to the second port, and a test board corresponding to a type of a device-under-test. A probe-effect is obtained by measuring the test board via the probe and the antenna.

Abstract: A method for predicting and debugging electromagnetic interference (EMI) characteristics of an integrated circuit (IC) system includes the following steps: selecting a frequency domain range according to transformed raw data of the IC system to generate a blocking frequency analysis result, wherein the transformed raw data are transformed by a time-frequency waveform transformation; setting criteria data; comparing the blocking frequency analysis result with the criteria data to generate at least one comparison result; and generating a pass analysis report when a processing unit determines that each comparison result is passed; otherwise, executing an EMI design time-frequency analysis.

Abstract: A method for predicting and debugging electromagnetic interference (EMI) characteristics of an integrated circuit (IC) system includes the following steps: selecting a frequency domain range according to transformed raw data of the IC system to generate a blocking frequency analysis result, wherein the transformed raw data are transformed by a time-frequency waveform transformation; setting criteria data; comparing the blocking frequency analysis result with the criteria data to generate at least one comparison result; and generating a pass analysis report when a processing unit determines that each comparison result is passed; otherwise, executing an EMI design time-frequency analysis.